High numerical aperture tabletop soft x-ray diffraction microscopy with 70-nm resolution

Proceedings of the National Academy of Sciences of the United States of America

Volumn 105, Issue 1, 2008, Pages 24-27

  Sandberg, Richard L ^a   Song, Changyong ^b   Wachulak, Przemyslaw W ^c   Raymondson, Daisy A ^a   Paul, Ariel ^a   Amirbekian, Bagrat ^b   Lee, Edwin ^b   Sakdinawat, Anne E ^d   La O Vorakiat, Chan ^a   Marconi, Mario C ^c   Menoni, Carmen S ^c   Murnane, Margaret M ^a   Rocca, Jorge J ^c   Kapteyn, Henry C ^a   Miao, Jianwei ^b  

^a UNIVERSITY OF COLORADO   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c Department of Civil and Environmental Engineering   (United States)

^d LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

Extreme ultraviolet; Imaging; Lensless; Nanoscale; Ultrafast

Indexed keywords

ARTICLE; IMAGING; MICROSCOPE; MICROSCOPY; NANOTECHNOLOGY; OPTICS; PRIORITY JOURNAL; X RAY DIFFRACTION;

ALGORITHMS; EQUIPMENT DESIGN; IMAGE INTERPRETATION, COMPUTER-ASSISTED; LASERS; LENSES; MICROSCOPY; NANOPARTICLES; NANOTECHNOLOGY; OPTICS; ULTRAVIOLET RAYS; X-RAY DIFFRACTION;

EID: 38349135112     PISSN: 00278424     EISSN: 10916490     Source Type: Journal    
DOI: 10.1073/pnas.0710761105     Document Type: Article

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