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Volumn 102, Issue 12, 2013, Pages

Characterization and suppression of low-frequency noise in Si/SiGe quantum point contacts and quantum dots

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE NOISE; CHARGE STATE; ELECTRON NUMBER; FREQUENT SWITCHING; LOW-FREQUENCY NOISE; MODULATION-DOPED; PINCH OFF VOLTAGE; QUANTUM POINT CONTACT;

EID: 84875950958     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4799287     Document Type: Article
Times cited : (33)

References (22)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.