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Volumn 15, Issue 9, 2013, Pages 1680-1684

Epitaxial growth of heavily boron-doped Si by Al(B)-induced crystallisation at low temperature for back surface field manufacturing

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EID: 84875797519     PISSN: None     EISSN: 14668033     Source Type: Journal    
DOI: 10.1039/c2ce26563j     Document Type: Article
Times cited : (11)

References (22)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.