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Advanced Materials

Volumn 25, Issue 12, 2013, Pages 1724-1728

Ultralow reflection from a-Si nanograss/Si nanofrustum double layers

(5) Ravipati, Srikanth a Shieh, Jiann b Ko, Fu Hsiang a Yu, Chen Chieh c Chen, Hsuen Li c

a NATIONAL CHIAO TUNG UNIVERSITY (Taiwan)

b NATIONAL UNITED UNIVERSITY (Taiwan)

c NATIONAL TAIWAN UNIVERSITY (Taiwan)

Author keywords

absorption; black materials; heterostructures; ultralow reflection

Indexed keywords

AMORPHOUS SI; ANGLES OF INCIDENCE; BLACK MATERIALS; DOUBLE LAYERS; LAYERED NANOSTRUCTURE; PACKING DENSITY; SI SUBSTRATES; SMOOTH TRANSITIONS;

ABSORPTION; HETEROJUNCTIONS; NANOSTRUCTURES; REFRACTIVE INDEX; SILICON;

AMORPHOUS SILICON;

EID: 84875128719 PISSN: 09359648 EISSN: 15214095 Source Type: Journal
DOI: 10.1002/adma.201204235 Document Type: Article

Times cited : (25)

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