Optical absorption enhancement in amorphous silicon nanowire and nanocone arrays

Nano Letters

Volumn 9, Issue 1, 2009, Pages 279-282

  Zhu, Jia ^a,c   Yu, Zongfu ^a,b,c   Burkhart, George F ^a,b,c   Hsu, Ching Mei ^a,c   Connor, Stephen T ^a,b,c   Xu, Yueqin ^a,c   Wang, Qi ^a,c   McGehee, Michael ^a,c   Fan, Shanhui ^a,c   Cui, Yi ^a,c  

^a Stanford University   (United States)

^b STANFORD UNIVERSITY   (United States)

^c NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

A-SI:H; AMORPHOUS SI; ANGLES OF INCIDENCES; ANTIREFLECTION LAYERS; BAND-GAP EDGES; COMPATIBLE PROCESS; EFFECTIVE REFRACTIVE INDICES; ENERGY-CONVERSION EFFICIENCIES; ENHANCED ABSORPTIONS; ENHANCEMENT EFFECTS; EXPERIMENTAL DATUM; IMPEDANCE-MATCHING; NANO-CONES; NANOCONE ARRAYS; OPTICAL ABSORPTIONS;

ABSORPTION; CONVERSION EFFICIENCY; ELECTRIC WIRE; ENERGY CONVERSION; LIGHT ABSORPTION; NANOWIRES; REFRACTIVE INDEX; SEMICONDUCTING SILICON COMPOUNDS; SOLAR ENERGY; THIN FILMS;

AMORPHOUS SILICON;

NANOMATERIAL; SILICON;

ARTICLE; CHEMISTRY; CONFORMATION; CRYSTALLIZATION; LIGHT; MACROMOLECULE; MATERIALS TESTING; METHODOLOGY; NANOTECHNOLOGY; PARTICLE SIZE; RADIATION SCATTERING; REFRACTOMETRY; SURFACE PROPERTY; ULTRASTRUCTURE;

CRYSTALLIZATION; LIGHT; MACROMOLECULAR SUBSTANCES; MATERIALS TESTING; MOLECULAR CONFORMATION; NANOSTRUCTURES; NANOTECHNOLOGY; PARTICLE SIZE; REFRACTOMETRY; SCATTERING, RADIATION; SILICON; SURFACE PROPERTIES;

EID: 61749103132     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl802886y     Document Type: Article

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