Practical guide for validated memristance measurements

Review of Scientific Instruments

Volumn 84, Issue 2, 2013, Pages

  Du, Nan ^a,b   Shuai, Yao ^c   Luo, Wenbo ^c   Mayr, Christian ^d   Schüffny, René ^d   Schmidt, Oliver G ^a,b   Schmidt, Heidemarie ^a  

^a CHEMNITZ UNIVERSITY OF TECHNOLOGY   (Germany)

^b IFW DRESDEN   (Germany)

^c INSTITUTE OF ION BEAM PHYSICS AND MATERIALS RESEARCH   (Germany)

^d DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CIRCUIT REALIZATION; CURRENT VOLTAGE CURVE; MEASUREMENT POINTS; MEASUREMENT TIME; MEMRISTANCE; MEMRISTOR; PRACTICAL GUIDE; THIN-FILM CAPACITORS;

CIRCUIT THEORY; HYSTERESIS; INDEPENDENT COMPONENT ANALYSIS; MEMRISTORS; PASSIVE FILTERS; RESISTORS; THIN FILM CIRCUITS;

CURRENT VOLTAGE CHARACTERISTICS;

EID: 84874926913     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4775718     Document Type: Conference Paper

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