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Journal of Applied Physics

Volumn 107, Issue 1, 2010, Pages

Effect of film thickness on the thermal resistance of confined semiconductor thin films

(2) Landry, E S a McGaughey, A J H a

a CARNEGIE MELLON UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CLASSICAL LIMITS; FREQUENCY DEPENDENCE; GE FILMS; INCIDENCE ANGLES; LATTICE DYNAMICS; MD SIMULATION; MOLECULAR DYNAMICS SIMULATIONS; PHONON MEAN FREE PATH; PHONON TRANSPORT; SEMICONDUCTOR THIN FILMS; THERMAL RESISTANCE; TRANSMISSION COEFFICIENTS; VIBRATIONAL STATE;

BALLISTICS; CRYSTAL LATTICES; FORECASTING; GERMANIUM; HEAT RESISTANCE; MAGNETIC FILMS; MOLECULAR DYNAMICS; PHONONS; SOLIDS; THIN FILMS;

FILM THICKNESS;

EID: 75649133547 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3275506 Document Type: Article

Times cited : (73)

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