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Journal of Applied Physics

Volumn 108, Issue 10, 2010, Pages

Effect of microstructure on Au/sapphire interfacial thermal resistance

(3) Xu, Yibin a Kato, Ryozo a Goto, Masahiro a

a NATIONAL INSTITUTE FOR MATERIALS SCIENCE (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALED SAMPLES; AU FILM; AVERAGE GRAIN SIZE; CHEMICAL BONDINGS; CRYSTAL TEXTURE; EVAPORATED FILMS; EVAPORATION METHOD; FREQUENCY DOMAINS; GRAIN SIZE; INTERFACIAL THERMAL RESISTANCE; MICROSTRUCTURE CHARACTERISTICS; SAPPHIRE SUBSTRATES; SPUTTERED FILMS; THERMAL RESISTANCE; THERMOREFLECTANCE;

CHEMICAL BONDS; CRYSTAL MICROSTRUCTURE; GRAIN SIZE AND SHAPE; SINGLE CRYSTALS; SUBSTRATES; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

GOLD;

EID: 78650290036 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3514563 Document Type: Conference Paper

Times cited : (38)

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