Atomic rearrangements in amorphous Al2O3 under electron-beam irradiation

Journal of Applied Physics

Volumn 113, Issue 6, 2013, Pages

  Nakamura, R ^a   Ishimaru, M ^b   Yasuda, H ^b   Nakajima, H ^b  

^a Osaka Prefecture University   (Japan)

^b OSAKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ACCELERATION VOLTAGES; AMORPHOUS STATE; ATOMIC REARRANGEMENTS; BASIC UNITS; CRYSTALLINE GRAINS; ELECTRON ENERGIES; ELECTRON-BEAM IRRADIATIONS; ELECTRONIC EXCITATION; IN-SITU TRANSMISSION ELECTRON MICROSCOPIES; NANO-VOIDS; RADIAL DISTRIBUTION ANALYSIS;

EXCITED STATES; IRRADIATION; TRANSMISSION ELECTRON MICROSCOPY;

ALUMINUM;

EID: 84874332096     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4790705     Document Type: Article

References (39)

1. I. Levin and D. Brandon, J. Am. Ceram. Soc. 81, 1995 (1998). 10.1111/j.1151-2916.1998.tb02581.x
2. G. Gutierrez and B. Johansson, Phys. Rev. B 65, 104202 (2002). 10.1103/PhysRevB.65.104202
3. P. Vashishta, R. K. Kalia, A. Nakano, and J. P. Rino, J. Appl. Phys. 103, 083504 (2008). 10.1063/1.2901171
4. S. K. Lee, S. B. Lee, S. Y. Park, Y. S. Yi, and C. W. Ahn, Phys. Rev. Lett. 103, 095501 (2009). 10.1103/PhysRevLett.103.095501
5. R. Nakamura, T. Shudo, A. Hirata, M. Ishimaru, and H. Nakajima, Scr. Mater. 64, 197 (2011). 10.1016/j.scriptamat.2010.09.043
6. M. Tane, S. Nakano, R. Nakamura, H. Ogi, M. Ishimaru, H. Kimizuka, and H. Nakajima, Acta Mater. 59, 4631 (2011). 10.1016/j.actamat.2011.04.008
7. R. Nakamura, M. Ishimaru, A. Hirata, K. Sato, M. Tane, H. Kimizuka, T. Shudo, T. J. Konno, and H. Nakajima, J. Appl. Phys. 110, 064324 (2011). 10.1063/1.3639290
8. M. Digne, P. Sautet, P. Raybaud, P. Euzen, and H. Toulhoat, J. Catal. 226, 54 (2004). 10.1016/j.jcat.2004.04.020
9. D. G. Howitt and T. E. Mitchell, Philos. Mag. A 44, 229 (1981). 10.1080/01418618108244504
10. F. W. Clinard, Jr., G. F. Hurley, and L. W. Hobbs, J. Nucl. Mater. 108, 655-670 (1982). 10.1016/0022-3115(82)90538-4
11. A. Y. Stathopoulos and G. P. Pells, Philos. Mag. A 47, 381 (1983). 10.1080/01418618308245234
12. J. E. Bonevich and L. D. Marks, Ultramicroscopy 35, 161 (1991). 10.1016/0304-3991(91)90101-B
13. Y. Tomokiyo, T. Kuroiwa, and C. Kinoshita, Ultramicroscopy 39, 213 (1991). 10.1016/0304-3991(91)90200-P
14. G. P. Pells and T. Shikama, Philos. Mag. A 48, 779 (1983). 10.1080/01418618308236544
15. G. P. Pells and D. C. Phillips, J. Nucl. Mater. 80, 207 (1979). 10.1016/0022-3115(79)90183-1
16. G. P. Pells and D. C. Phillips, J. Nucl. Mater. 80, 215 (1979). 10.1016/0022-3115(79)90184-3
17. T. Shikama and G. P. Pells, Philos. Mag. A 47, 369 (1983). 10.1080/01418618308245233
18. S. H. Oh, Y. Kauffmann, C. Scheu, W. D. Kaplan, and M. Ruhle, Science 310, 661 (2005). 10.1126/science.1118611
19. S. D. Berger, I. G. Salisbury, R. H. Milne, D. Imeson, and C. J. Humphreys, Philos. Mag. B 55, 341 (1987). 10.1080/13642818708208619
20. C. L. Chen, H. Furusho, and H. Mori, Philos. Mag. Lett. 90, 715 (2010). 10.1080/09500839.2010.501768
21. C. L. Chen, K. Arakawa, and H. Mori, Scr. Mater. 63, 355 (2010). 10.1016/j.scriptamat.2010.04.007
22. C. L. Chen, K. Arakawa, J. G. Lee, and H. Mori, Scr. Mater. 63, 1013 (2010). 10.1016/j.scriptamat.2010.07.028
23. C. Pan, P. Shen, and S.-Y. Chen, J. Cryst. Growth 299, 393 (2007). 10.1016/j.jcrysgro.2006.12.006
24. J. Murray, K. Song, W. Huebner, and M. O'Keefe, Mater. Lett. 74, 12 (2012). 10.1016/j.matlet.2012.01.039
25. M. Liu, L. Xu, and X. Lin, Scanning 16, 1 (1994). 10.1002/sca.4950160102
26. X.-w. Du, M. Takeguchi, M. Tanaka, and K. Furuya, Appl. Phys. Lett. 82, 1108 (2003). 10.1063/1.1555691
27. I. Stark, M. Stordeur, and F. Syrowatka, Thin Solid Films 226, 185-190 (1993). 10.1016/0040-6090(93)90227-G
28. L. Ba, Y. Qin, and Z. Wu, J. Appl. Phys. 80, 6170 (1996). 10.1063/1.363691
29. 3 film (a) before and (b) after irradiation at 200 keV. The arrows in the BFIs indicate an identical indium nanoparticle before and after irradiation.
30. E. Balanzat and S. Bouffard, Solid State Phenom. 30-31, 7 (1992). 10.4028/www.scientific.net/SSP.30-31.7
31. S. J. Zinkle and C. Kinoshita, J. Nucl. Mater. 251, 200 (1997). 10.1016/S0022-3115(97)00224-9
32. A. Meldrum, L. A. Boatner, and R. C. Ewing, J. Mater. Res. 12, 1816 (1997). 10.1557/JMR.1997.0250
33. Y. Hirotsu, M. Ishimaru, T. Ohkubo, T. Hanada, and M. Sugiyama, J. Electron Microsc. 50, 435 (2001). 10.1093/jmicro/50.6.435
34. M. Ishimaru, Nucl. Instrum. Methods Phys. Res. B 250, 309 (2006). 10.1016/j.nimb.2006.04.129
35. P. Lamparter and R. Kniep, Physica B 234-236, 405 (1997). 10.1016/S0921-4526(96)01044-7
36. For example, see S. R. Elliott, Physics of Amorphous Materials, 2nd ed. (Longman Scientific Technical, 1990), p. 81.
37. W. Qin, J. A. Szpunar, and Y. Umakoshi, Acta Mater. 59, 2221 (2011). 10.1016/j.actamat.2010.12.025
38. J. W. Corbett, Electron Radiation Damage in Semiconductors and Metals (Academic, New York, 1966).
39. M. L. Knotek and P. J. Feibelman, Phys. Rev. Lett. 40, 964 (1978). 10.1103/PhysRevLett.40.964