메뉴 건너뛰기




Volumn 74, Issue , 2012, Pages 12-15

Electron beam induced crystallization of sputter deposited amorphous alumina thin films

Author keywords

Alumina; Amorphous; Capacitor; Crystallization; Thin film

Indexed keywords

ACCELERATING VOLTAGES; AMORPHOUS ALUMINA; BRIGHT FIELDS; DARK FIELD; ELECTRON BEAM-INDUCED CRYSTALLIZATION; RING PATTERNS; SELECTED-AREA DIFFRACTION PATTERNS; TEM IMAGES; THIN-FILM CAPACITORS; TRANSMISSION ELECTRON MICROSCOPE;

EID: 84856777536     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matlet.2012.01.039     Document Type: Article
Times cited : (35)

References (17)
  • 1
    • 17644366437 scopus 로고    scopus 로고
    • Electrical properties of amorphous aluminum oxide thin films
    • DOI 10.1016/j.actamat.2005.02.027, PII S1359645405001072
    • P. Katiyar, C. Jin, and R.J. Narayan Electrical properties of amorphous aluminum oxide thin films Acta Mater 53 2005 2617 2622 (Pubitemid 40556693)
    • (2005) Acta Materialia , vol.53 , Issue.9 , pp. 2617-2622
    • Katiyar, P.1    Jin, C.2    Narayan, R.J.3
  • 3
    • 0036531451 scopus 로고    scopus 로고
    • Crystallization of amorphous alumina films induced by high-energy ion irradiation
    • S. Nakao, P. Jin, G. Xu, M. Ikeyama, Y. Miyagawa, and S. Miyagawa Crystallization of amorphous alumina films induced by high-energy ion irradiation J Cryst Growth 2002 237 239
    • (2002) J Cryst Growth , pp. 237-239
    • Nakao, S.1    Jin, P.2    Xu, G.3    Ikeyama, M.4    Miyagawa, Y.5    Miyagawa, S.6
  • 4
    • 0035947203 scopus 로고    scopus 로고
    • Elaboration, characterization and dielectric properties study of amorphous alumina thin films deposited by r.f. magnetron sputtering
    • DOI 10.1016/S0042-207X(01)00114-2, PII S0042207X01001142
    • B.G. Segda, M. Jacquet, and J.P. Besse Elaboration, characterization and dielectric properties study of amorphous alumina thin films deposited by r.f. magnetron sputtering Vacuum 62 2001 27 38 (Pubitemid 32427173)
    • (2001) Vacuum , vol.62 , Issue.1 , pp. 27-38
    • Segda, B.G.1    Jacquet, M.2    Besse, J.P.3
  • 5
    • 0036567764 scopus 로고    scopus 로고
    • 3 film deposited at low temperatures
    • DOI 10.1016/S0022-3093(02)00968-7, PII S0022309302009687
    • 3 film deposited at low temperatures J Non-Cryst Solids 303 2002 78 82 (Pubitemid 34410829)
    • (2002) Journal of Non-Crystalline Solids , vol.303 , Issue.1 , pp. 78-82
    • Ha, W.H.1    Choo, M.H.2    Im, S.3
  • 7
    • 77956145713 scopus 로고    scopus 로고
    • Structure and disorder in amorphous alumina thin films: Insights from high-resolution solid-state NMR
    • S.K. Lee, S.Y. Park, Y.S. Yi, and J. Moon Structure and disorder in amorphous alumina thin films: insights from high-resolution solid-state NMR J Phys Chem C 114 2010 13890 13894
    • (2010) J Phys Chem C , vol.114 , pp. 13890-13894
    • Lee, S.K.1    Park, S.Y.2    Yi, Y.S.3    Moon, J.4
  • 8
    • 0019543851 scopus 로고
    • Electron-beam-induced crystallization of anodic barrier films on aluminum
    • DOI 10.1016/0040-6090(81)90323-0
    • K. Shimizu, G.E. Thompson, and G.C. Wood Electron-beam-induced crystallization of anodic barrier films on aluminum Thin Solid Films 77 1981 313 318 (Pubitemid 11494961)
    • (1981) Thin Solid Films , vol.77 , Issue.4 , pp. 313-318
    • Shimizu, K.1    Thompson, G.E.2    Wood, G.C.3
  • 9
    • 79551484010 scopus 로고    scopus 로고
    • Electron or ion irradiation-induced phase-change mechanism between amorphous and crystalline state
    • W. Qin, J.A. Szpunar, and Y. Umakoshi Electron or ion irradiation-induced phase-change mechanism between amorphous and crystalline state Acta Mater 59 2011 2221 2228
    • (2011) Acta Mater , vol.59 , pp. 2221-2228
    • Qin, W.1    Szpunar, J.A.2    Umakoshi, Y.3
  • 12
    • 4944222322 scopus 로고    scopus 로고
    • In situ transmission electron microscopy analysis of electron beam induced crystallization of amorphous marks in phase-change materials
    • M. Kaiser, L. van Pieterson, and M.A. Verheijen In situ transmission electron microscopy analysis of electron beam induced crystallization of amorphous marks in phase-change materials J Appl Phys 96 2004 3193 3198
    • (2004) J Appl Phys , vol.96 , pp. 3193-3198
    • Kaiser, M.1    Van Pieterson, L.2    Verheijen, M.A.3
  • 13
    • 33645709029 scopus 로고    scopus 로고
    • Electron-beam detection of bits reversibly recorded on epitaxial InSe/GaSe/Si phase-change diodes
    • A. Chaiken, G.A. Gibson, J. Chen, B.S. Yeh, J.B. Jasinski, and Z. Liliental-Weber Electron-beam detection of bits reversibly recorded on epitaxial InSe/GaSe/Si phase-change diodes Jpn J Appl Phys 45 2006 2580 2592
    • (2006) Jpn J Appl Phys , vol.45 , pp. 2580-2592
    • Chaiken, A.1    Gibson, G.A.2    Chen, J.3    Yeh, B.S.4    Jasinski, J.B.5    Liliental-Weber, Z.6
  • 14
    • 0032136488 scopus 로고    scopus 로고
    • Metastable alumina polymorphs: Crystal structures and transition sequences
    • I. Levin, and D. Brandon Metastable alumina polymorphs: crystal structures and transition sequences J Am Ceram Soc 81 1998 1995 2012 (Pubitemid 128599296)
    • (1998) Journal of the American Ceramic Society , vol.81 , Issue.8 , pp. 1995-2012
    • Levin, I.1    Brandon, D.2
  • 15
    • 6344275556 scopus 로고
    • JCPDS Joint Committee on Powder Diffraction Standards Swarthmore, PA
    • JCPDS Powder diffraction file; inorganic volume 1972 Joint Committee on Powder Diffraction Standards Swarthmore, PA
    • (1972) Powder Diffraction File; Inorganic Volume
  • 16
    • 79960037208 scopus 로고    scopus 로고
    • A microstructure for thermal conductivity measurement of conductive thin films
    • D. Thuau, I. Koymen, and R. Cheung A microstructure for thermal conductivity measurement of conductive thin films Microelectron Eng 88 2011 2408 2412
    • (2011) Microelectron Eng , vol.88 , pp. 2408-2412
    • Thuau, D.1    Koymen, I.2    Cheung, R.3
  • 17
    • 0027575865 scopus 로고
    • Thermal conductivity of thin amorphous alumina films
    • DOI 10.1016/0040-6090(93)90227-G
    • I. Stark, M. Stordeur, and F. Syrowatka Thermal conductivity of thin amorphous alumina films Thin Solid Films 226 1993 185 190 (Pubitemid 23639801)
    • (1993) Thin Solid Films , vol.226 , Issue.1 , pp. 185-190
    • Stark, I.1    Stordeur, M.2    Syrowatka, F.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.