Electron-beam radial distribution analysis of irradiation-induced amorphous SiC

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 250, Issue 1-2 SPEC. ISS., 2006, Pages 309-314

  Ishimaru, Manabu ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

Amorphous structure; Atomic pair distribution function; Energy filtering electron microscopy; Silicon carbide

Indexed keywords

AMORPHOUS SILICON; ELECTRON BEAMS; ELECTRON DIFFRACTION; ELECTRON MICROSCOPY; ELECTRON SCATTERING; ION BEAMS; SINGLE CRYSTALS; TRANSMISSION ELECTRON MICROSCOPY;

AMORPHOUS STRUCTURE; ATOMIC-PAIR DISTRIBUTION FUNCTION; ENERGY-FILTERING ELECTRON MICROSCOPY; HOMONUCLEAR SI-SI AND C-C BONDS;

SILICON CARBIDE;

EID: 33746302491     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2006.04.129     Document Type: Article

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