-
1
-
-
0033284471
-
Piezoelectric scanners for atomic force microscopes: Design of lateral sensors, identification and control
-
A. Daniele, S. Salapaka, M. V. Salapaka, and M. Dahleh, "Piezoelectric scanners for atomic force microscopes: design of lateral sensors, identification and control," in Proc. of the American Control Conference, 1999, pp. 253-257.
-
(1999)
Proc. of the American Control Conference
, pp. 253-257
-
-
Daniele, A.1
Salapaka, S.2
Salapaka, M.V.3
Dahleh, M.4
-
2
-
-
0029253967
-
Experimental verification of transfer functions for a slewing piezoelectric laminate beam
-
T. E. Alberts, T. V. DuBois, and H. R. Pota, "Experimental verification of transfer functions for a slewing piezoelectric laminate beam," Control Engineering Practice, vol. 3, no. 2, pp. 163-170, 1995.
-
(1995)
Control Engineering Practice
, vol.3
, Issue.2
, pp. 163-170
-
-
Alberts, T.E.1
DuBois, T.V.2
Pota, H.R.3
-
3
-
-
0036657429
-
A high-speed atomic force microscope for studying biological macromolecules in action
-
T. Ando, N. Kodera, D. Maruyama, E. Takai, K. Saito, and A. Toda, "A high-speed atomic force microscope for studying biological macromolecules in action," Japan. J. Appl. Phys., vol. 41, pp. 4851-4856, 2002.
-
(2002)
Japan. J. Appl. Phys
, vol.41
, pp. 4851-4856
-
-
Ando, T.1
Kodera, N.2
Maruyama, D.3
Takai, E.4
Saito, K.5
Toda, A.6
-
4
-
-
33947160949
-
Integral resonant control of collocated smart structures
-
S. Aphale, A. J. Fleming, and S. O. R. Moheimani, "Integral resonant control of collocated smart structures," Smart Materials and Structures, vol. 16, no. 2, pp. 439-446, 2007.
-
(2007)
Smart Materials and Structures
, vol.16
, Issue.2
, pp. 439-446
-
-
Aphale, S.1
Fleming, A.J.2
Moheimani, S.O.R.3
-
5
-
-
0001024297
-
Optical scan-correction system applied to atomic force microscopy
-
June
-
R. C. Barrett and C. F. Quate, "Optical scan-correction system applied to atomic force microscopy," Review of Scientific Instruments, vol. 62, no. 6, pp. 1393-9, June 1991.
-
(1991)
Review of Scientific Instruments
, vol.62
, Issue.6
, pp. 1393-1399
-
-
Barrett, R.C.1
Quate, C.F.2
-
6
-
-
38149070896
-
High-performance control of piezoelectric tube scanners
-
September
-
B. Bhikkaji, M. Ratnam, A. J. Fleming, and S. O. R. Moheimani, "High-performance control of piezoelectric tube scanners," IEEE Transactions on Control Systems Technology, vol. 5, no. 5, pp. 853- 866, September 2007.
-
(2007)
IEEE Transactions on Control Systems Technology
, vol.5
, Issue.5
, pp. 853-866
-
-
Bhikkaji, B.1
Ratnam, M.2
Fleming, A.J.3
Moheimani, S.O.R.4
-
7
-
-
34047150977
-
PVPF control of piezoelectric tube scanners
-
April
-
B. Bhikkaji, M. Ratnam, and S. O. R. Moheimani, "PVPF control of piezoelectric tube scanners," Sensors & Actuators: A. Physical, vol. 135, no. 2, pp. 700-712, April 2007.
-
(2007)
Sensors & Actuators: A. Physical
, vol.135
, Issue.2
, pp. 700-712
-
-
Bhikkaji, B.1
Ratnam, M.2
Moheimani, S.O.R.3
-
8
-
-
36549095714
-
Single-tube three-dimensional scanner for scanning tunneling microscopy
-
August
-
G. Binnig and D. P. E. Smith, "Single-tube three-dimensional scanner for scanning tunneling microscopy," Review of Scientific Instruments, vol. 57, no. 8, pp. 1688-1689, August 1986.
-
(1986)
Review of Scientific Instruments
, vol.57
, Issue.8
, pp. 1688-1689
-
-
Binnig, G.1
Smith, D.P.E.2
-
9
-
-
0026897007
-
In situ testing and calibration of piezoelectric tube scanners
-
C. J. Chen, "In situ testing and calibration of piezoelectric tube scanners," Ultramicroscopy, vol. 42-44, pp. 1653-1658, 1992.
-
(1992)
Ultramicroscopy
, vol.42-44
, pp. 1653-1658
-
-
Chen, C.J.1
-
10
-
-
42549104588
-
A survey of control issues in nanopositioning
-
September
-
S. Devasia, E. Eleftheriou, and S. O. R. Moheimani, "A survey of control issues in nanopositioning," IEEE Transactions on Control Systems Technology, vol. 15, no. 5, pp. 802-823, September 2007.
-
(2007)
IEEE Transactions on Control Systems Technology
, vol.15
, Issue.5
, pp. 802-823
-
-
Devasia, S.1
Eleftheriou, E.2
Moheimani, S.O.R.3
-
11
-
-
0034857597
-
Coupling in piezoelectric tube scanners used in scanning probe microscopes
-
Arlington, VA
-
O. M. El Rifai and K. Youcef-Tomi, "Coupling in piezoelectric tube scanners used in scanning probe microscopes," in Proc. American Control Conference, Arlington, VA, 2001, pp. 3251-3255.
-
(2001)
Proc. American Control Conference
, pp. 3251-3255
-
-
El Rifai, O.M.1
Youcef-Tomi, K.2
-
12
-
-
0025410869
-
Positive position feedback-control for large space structures
-
April
-
J. L. Fanson and T. K. Caughey, "Positive position feedback-control for large space structures," AIAA Journal, vol. 28, no. 4, pp. 717-724, April 1990.
-
(1990)
AIAA Journal
, vol.28
, Issue.4
, pp. 717-724
-
-
Fanson, J.L.1
Caughey, T.K.2
-
13
-
-
32944468063
-
Sensorless vibration suppression and scan compensation for piezoelectric tube nanopositioners
-
A. J. Fleming and S. O. R. Moheimani, "Sensorless vibration suppression and scan compensation for piezoelectric tube nanopositioners," IEEE Transactions on Control Systems Technology, vol. 14, no. 1, pp. 33-44, 2006.
-
(2006)
IEEE Transactions on Control Systems Technology
, vol.14
, Issue.1
, pp. 33-44
-
-
Fleming, A.J.1
Moheimani, S.O.R.2
-
14
-
-
48649090397
-
Sensor fusion for improved control of piezoelectric tube scanners
-
Zurich, Switzerland, September
-
A. J. Fleming, A. Wills, and S. O. R. Moheimani, "Sensor fusion for improved control of piezoelectric tube scanners," in Proc. IEEE/ASME Confernece on Advanced Intelligent Mechatronics, Zurich, Switzerland, September 2007.
-
(2007)
Proc. IEEE/ASME Confernece on Advanced Intelligent Mechatronics
-
-
Fleming, A.J.1
Wills, A.2
Moheimani, S.O.R.3
-
16
-
-
2442420029
-
Identification and open-loop tracking control of a piezoelectric tube scanner for high-speed scanning-probe microscopy
-
G. Schitter and A. Stemmer, "Identification and open-loop tracking control of a piezoelectric tube scanner for high-speed scanning-probe microscopy," IEEE Transaction on Control System Technology, vol. 12, no. 3, pp. 449-454, 2004.
-
(2004)
IEEE Transaction on Control System Technology
, vol.12
, Issue.3
, pp. 449-454
-
-
Schitter, G.1
Stemmer, A.2
-
17
-
-
0022027571
-
On the stability problem caused by finite actuator dynamics in the collocated control of large space structures
-
C. J. Goh and T. K. Caughey, "On the stability problem caused by finite actuator dynamics in the collocated control of large space structures," International Journal of Control, vol. 41, no. 3, pp. 787-802, 1985.
-
(1985)
International Journal of Control
, vol.41
, Issue.3
, pp. 787-802
-
-
Goh, C.J.1
Caughey, T.K.2
-
19
-
-
18744378027
-
Active damping of the scanner for high-speed atomic force microscopy
-
N. Kodera, H. Yamashita, and T. Ando, "Active damping of the scanner for high-speed atomic force microscopy," Review of Scientific Instruments, vol. 76, pp. 1-5, 2005.
-
(2005)
Review of Scientific Instruments
, vol.76
, pp. 1-5
-
-
Kodera, N.1
Yamashita, H.2
Ando, T.3
-
20
-
-
70449624586
-
A modified positive-real type stabilitycondition
-
San Diego, CA, USA, Dec
-
A. Lanzon and I. R. Petersen, "A modified positive-real type stabilitycondition," in Proceedings of the 2007 European Control Conference, San Diego, CA, USA, Dec 2006, pp. 31-36.
-
(2006)
Proceedings of the 2007 European Control Conference
, pp. 31-36
-
-
Lanzon, A.1
Petersen, I.R.2
-
23
-
-
27844552525
-
Resonant control ofstructural vibration using charge-driven piezoelectric actuators
-
S. O. R. Moheimani and B. J. G. Vautier, "Resonant control ofstructural vibration using charge-driven piezoelectric actuators," IEEE Transactions on Control Systems Technology, vol. 13, no. 6, pp. 1021- 1035, 2005.
-
(2005)
IEEE Transactions on Control Systems Technology
, vol.13
, Issue.6
, pp. 1021-1035
-
-
Moheimani, S.O.R.1
Vautier, B.J.G.2
-
24
-
-
33646041580
-
Experimental implementation of extended multivariable PPF control on an active structure
-
May
-
S. O. R. Moheimani, B. J. G. Vautier, and B. Bhikkaji, "Experimental implementation of extended multivariable PPF control on an active structure," IEEE Transactions on Control Systems Technology, vol. 14, no. 3, pp. 443-445, May 2006.
-
(2006)
IEEE Transactions on Control Systems Technology
, vol.14
, Issue.3
, pp. 443-445
-
-
Moheimani, S.O.R.1
Vautier, B.J.G.2
Bhikkaji, B.3
-
26
-
-
41949117355
-
Scanning probe microscopy
-
April
-
S. Salapaka and M. Salapaka, "Scanning probe microscopy," IEEE Control Systems Magazine, vol. 28, no. 2, pp. 65-83, April 2008.
-
(2008)
IEEE Control Systems Magazine
, vol.28
, Issue.2
, pp. 65-83
-
-
Salapaka, S.1
Salapaka, M.2
-
27
-
-
0035419646
-
High performance feedback for fast scanning atomic force microscopes
-
G. Schitter, P. Menold, H. F. Knapp, F. Allgower, and A. Stemmer, "High performance feedback for fast scanning atomic force microscopes," Review of Scientific Instruments, vol. 72, no. 8, pp. 3320- 3327, 2001.
-
(2001)
Review of Scientific Instruments
, vol.72
, Issue.8
, pp. 3320-3327
-
-
Schitter, G.1
Menold, P.2
Knapp, H.F.3
Allgower, F.4
Stemmer, A.5
-
28
-
-
0028756247
-
Feedback control of piezoelectric tubescanners
-
Lake Buena Vista, FL, December
-
N. Tamer and M. Dahleh, "Feedback control of piezoelectric tubescanners," in Proc. of the 33rd IEEE Conference on Decision and Control, Lake Buena Vista, FL, December 1994, pp. 1826-1831.
-
(1994)
Proc. of the 33rd IEEE Conference on Decision and Control
, pp. 1826-1831
-
-
Tamer, N.1
Dahleh, M.2
-
29
-
-
0002849393
-
Dynamics of piezoelectric tube scanners for scanning probe microscopy
-
M. E. Taylor, "Dynamics of piezoelectric tube scanners for scanning probe microscopy," Review of Scientific Instruments, vol. 64, no. 1, pp. 154-158, 1993.
-
(1993)
Review of Scientific Instruments
, vol.64
, Issue.1
, pp. 154-158
-
-
Taylor, M.E.1
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