ZnO UV photodetector with controllable quality factor and photosensitivity

AIP Advances

Volumn 3, Issue 2, 2013, Pages

  Campos, L C ^a,b   Guimaraes M H D ^c   Goncalves, A M B ^a   De Oliveira, S ^a   Lacerda, R G ^a  

^a FEDERAL UNIVERSITY OF MINAS GERAIS   (Brazil)

^b MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^c UNIVERSITY OF GRONINGEN   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL MODIFICATION; II-VI SEMICONDUCTORS; LIGHT SENSITIVE MATERIALS; OXIDE MINERALS; PHOTONS; PHOTOSENSITIVITY; Q FACTOR MEASUREMENT; ZINC OXIDE;

CONTROLLABLE QUALITY; NOVEL APPLICATIONS; PHOTO DETECTION; PHOTOCURRENT GENERATIONS; QUALITY FACTORS; SURFACE CHEMICAL MODIFICATIONS; UV PHOTODETECTION; UV PHOTODETECTORS;

PHOTODETECTORS;

EID: 84874182882     PISSN: None     EISSN: 21583226     Source Type: Journal    
DOI: 10.1063/1.4790633     Document Type: Article

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