Crack-free AlGaN for solar-blind focal plane arrays through reduced area epitaxy

Applied Physics Letters

Volumn 102, Issue 5, 2013, Pages

  Cicek, E ^a   McClintock, R ^a   Vashaei, Z ^a   Zhang, Y ^a   Gautier, S ^a   Cho, C Y ^a   Razeghi, M ^a  

^a Northwestern University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AL-CONTENT; ALGAN; ALN; BIAXIAL STRAINS; CRACK FREE; EXTERNAL QUANTUM EFFICIENCY; HIGH-QUALITY IMAGING; LATERAL DIMENSION; OPTICAL CHARACTERISTICS; RESPONSIVITY; REVERSE BIAS; SOLAR-BLIND;

ALUMINUM; EPITAXIAL GROWTH; PIXELS;

CRACKS;

EID: 84874031580     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4790839     Document Type: Article

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