Nanoscale subsurface- and material-specific identification of single nanoparticles

Optics Express

Volumn 19, Issue 21, 2011, Pages 20865-20875

  Nuño, Zachary ^a   Hessler, Brandon ^a   Ochoa, Jerry ^a   Shon, Young Seok ^a   Bonney, Codi ^a   Abate, Yohannes ^a  

^a CALIFORNIA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

NANOPARTICLES; NEAR FIELD SCANNING OPTICAL MICROSCOPY; REFRACTIVE INDEX; SILICA;

AU NANOPARTICLE; CAPPING LAYER; DIPOLE MODEL; HIGH RESOLUTION; IMAGE CONTRASTS; MIDINFRARED; NANO SCALE; OPTICAL CONTRAST; PLASMON RESONANCES; SCATTERING-TYPE SCANNING NEAR-FIELD OPTICAL MICROSCOPY (S-SNOM); SINGLE NANOPARTICLE; VISIBLE WAVELENGTHS;

GOLD;

GOLD; METAL NANOPARTICLE; SILICON; SILICON DIOXIDE;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; EQUIPMENT DESIGN; INFRARED RADIATION; MATERIALS TESTING; METHODOLOGY; MICROSCOPY; NANOTECHNOLOGY; OPTICS; REFRACTOMETRY; SURFACE PLASMON RESONANCE; SURFACE PROPERTY; TRANSMISSION ELECTRON MICROSCOPY;

EQUIPMENT DESIGN; GOLD; INFRARED RAYS; MATERIALS TESTING; METAL NANOPARTICLES; MICROSCOPY; MICROSCOPY, ATOMIC FORCE; MICROSCOPY, ELECTRON, TRANSMISSION; NANOTECHNOLOGY; OPTICS AND PHOTONICS; REFRACTOMETRY; SILICON; SILICON DIOXIDE; SURFACE PLASMON RESONANCE; SURFACE PROPERTIES;

EID: 80053974545     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.19.020865     Document Type: Article

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