Inversion domain boundaries on tin (Sn)-doped ZnO nanobelts: Aberration-corrected scanning transmission electron microscopy study

Applied Physics Letters

Volumn 102, Issue 3, 2013, Pages

  Park, Yun Chang ^a   Kim, Young Heon ^b   Nahm, Ho Hyun ^b   Noh, Ji Young ^b   Kim, Yong Sung ^b   Kim, Joondong ^c   Lee, Won Seok ^d   Yang, Jun Mo ^a   Park, Jeonghee ^e  

^a National Nano Fab Center (NNFC)   (South Korea)

^b Korea Research Institute of Standards and Science   (South Korea)

^c Kunsan National University   (South Korea)

^d Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^e Korea University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATION-CORRECTED; DENSITY FUNCTIONAL THEORY CALCULATIONS; DOPED ZNO; ELECTRON ENERGY-LOSS SPECTRA; INTERPLANAR SPACINGS; INVERSION DOMAIN BOUNDARIES; SCANNING TRANSMISSION ELECTRON MICROSCOPY; STACKING LAYERS; STEM ANALYSIS; WURTZITES;

DENSITY FUNCTIONAL THEORY; ELECTRON ENERGY LOSS SPECTROSCOPY; NANOBELTS; TRANSMISSION ELECTRON MICROSCOPY; ZINC OXIDE; ZINC SULFIDE;

TIN;

EID: 84872938981     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4788812     Document Type: Article

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