Atomic structure of basal-plane inversion boundaries in SnO 2-doped ZnO

Microscopy and Microanalysis

Volumn 9, Issue SUPPL. 3, 2003, Pages 286-287

  Daneu, Nina ^a   Rečnik, Aleksander ^a   Walther, Thomas ^b   Mader, Werner ^b  

^a JO EF STEFAN INSTITUTE   (Slovenia)

^b UNIVERSITY OF BONN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0142027665     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/s1431927603024024     Document Type: Conference Paper

References (3)

1. Rečnik A, Daneu N, Walther T, Mader W, J Am Ceram Soc 84 (2001) 2657-2668.
2. Daneu N, Rečnik A, Bernik S, Kolar D, J Am Ceram Soc 83 (2000) 3165-3171.
3. Walther T, Daneu N, Rečnik A, Interface Science (2003) in press.