Prospects for lithium imaging using annular bright field scanning transmission electron microscopy: A theoretical study

Ultramicroscopy

Volumn 111, Issue 8, 2011, Pages 1144-1154

  Findlay, S D ^a   Lugg, N R ^b   Shibata, N ^a,c   Allen, L J ^b   Ikuhara, Y ^a,d,e  

^a UNIVERSITY OF TOKYO   (Japan)

^b UNIVERSITY OF MELBOURNE   (Australia)

^c JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^d JAPAN FINE CERAMICS CENTER   (Japan)

^e TOHOKU UNIVERSITY   (Japan)

Author keywords

Annular bright field (ABF); Lithium; Scanning transmission electron microscopy (STEM)

Indexed keywords

ATOMIC RESOLUTION; BATTERY MATERIALS; BRIGHT FIELDS; CONTROLLABLE PARAMETERS; DIRECT IMAGING; LIGHT ATOMS; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SCANNING TRANSMISSION ELECTRON MICROSCOPY (STEM); THEORETICAL STUDY;

ELECTRONS; LITHIUM; SCANNING;

TRANSMISSION ELECTRON MICROSCOPY;

LITHIUM;

ANALYTIC METHOD; ARTICLE; BRIGHT FIELD MICROSCOPY; CONTRAST ENHANCEMENT; CRYSTAL STRUCTURE; ELECTRIC POTENTIAL; IMAGE ANALYSIS; IMAGE ENHANCEMENT; IMAGE PROCESSING; IMAGE QUALITY; IMAGING SYSTEM; MATHEMATICAL MODEL; MICROSCOPE IMAGE; THEORETICAL STUDY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 79959993873     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2011.03.005     Document Type: Article

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