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Journal of Applied Physics

Volumn 113, Issue 2, 2013, Pages

Fermi level tuning of topological insulator Bi2(Se xTe1-x)3 nanoplates

(7) Hao, Guolin a Qi, Xiang a Xue, Lin a Cai, Canying a Li, Jun a Wei, Xiaolin a Zhong, Jianxin a

a XIANGTAN UNIVERSITY (China)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION RATIO; ENERGY DISPERSIVE X-RAY SPECTROMETERS; NANOPLATES; SURFACE POTENTIAL DISTRIBUTIONS; TOPOLOGICAL INSULATORS;

ATOMIC FORCE MICROSCOPY; FERMI LEVEL; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

NANOSTRUCTURES;

EID: 84872740680 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.4774115 Document Type: Article

Times cited : (14)

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