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Volumn 46, Issue 5, 2013, Pages

Process dependence of H passivation and doping in H-implanted ZnO

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING TEMPERATURES; BAND EDGE; CATHODOLUMINESCENCE SPECTROSCOPY; DEEP LEVEL EMISSION; DEPTH-RESOLVED; DOPANT IMPLANTATION; H-PASSIVATION; IMPLANTATION DOSE; PL EMISSION; PROCESS DEPENDENCE; TEMPERATURE DEPENDENT; THERMAL ACTIVATION; VACANCY-RELATED DEFECTS; ZNO;

EID: 84872560685     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/46/5/055107     Document Type: Article
Times cited : (18)

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    • Lee, E.-C.1    Chang, K.J.2
  • 33
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    • Ziegler J F 2008 SRIM, http://www.srim.org
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    • Ziegler, J.F.1
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    • 34250679310 scopus 로고    scopus 로고
    • CASINO V2.42 - A fast and easy-to-use modeling tool for scanning electron microscopy and microanalysis users
    • DOI 10.1002/sca.20000
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.