메뉴 건너뛰기




Volumn 85, Issue 23, 2004, Pages 5601-5603

"Hidden hydrogen" in as-grown ZnO

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING TEMPERATURE; INFRARED LINE; STRETCHING LINE; TUBE FURNACE;

EID: 12944254324     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1832736     Document Type: Article
Times cited : (155)

References (26)
  • 22
    • 12944289015 scopus 로고    scopus 로고
    • note
    • 2 / V s] differs from the early calibration of Thomas by a factor of near 2, similar to recent results of Seager and Myers (Ref. 16).
  • 23
    • 77956730156 scopus 로고    scopus 로고
    • edited by M. Stavola (Academic, Boston)
    • Uncertainties of a factor of 2 in the calibration of IR intensities are not uncommon. See, M. Stavola, in Identification of Defects in Semiconductors, edited by M. Stavola (Academic, Boston, 1999), p. 153.
    • (1999) Identification of Defects in Semiconductors , pp. 153
    • Stavola, M.1
  • 24
    • 12944315826 scopus 로고    scopus 로고
    • note
    • -3, i.e., of the same order of magnitude as our estimate of the possible concentration of unintentional H.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.