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2 / V s] differs from the early calibration of Thomas by a factor of near 2, similar to recent results of Seager and Myers (Ref. 16).
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23
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77956730156
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edited by M. Stavola (Academic, Boston)
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Uncertainties of a factor of 2 in the calibration of IR intensities are not uncommon. See, M. Stavola, in Identification of Defects in Semiconductors, edited by M. Stavola (Academic, Boston, 1999), p. 153.
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12944315826
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note
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-3, i.e., of the same order of magnitude as our estimate of the possible concentration of unintentional H.
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25
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0027677934
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2 in Si was discovered. See, for example, M. J. Binns, S. A. McQuaid, R. C. Newman, and E. C. Light-owlers, Semicond. Sci. Technol. 8, 1908 (1993).
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0347764798
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