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Volumn 92, Issue , 2013, Pages 65-69

Thermal oxidation of amorphous GaSe thin films

Author keywords

Characterization; Gallium oxide; Thin film

Indexed keywords

COMPLETE OXIDATION; GALLIUM OXIDES; HEXAGONAL CRYSTAL STRUCTURE; MONOCLINIC PHASE; MORPHOLOGICAL CHARACTERISTIC; OPTICAL ENERGY GAP; POLYCRYSTALLINE; ROOM TEMPERATURE; THERMAL OXIDATION; TRANSMITTANCE MEASUREMENTS; UV-VIS-NIR SPECTROSCOPY;

EID: 84872360441     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.vacuum.2012.12.001     Document Type: Article
Times cited : (19)

References (32)
  • 22
    • 0031109069 scopus 로고    scopus 로고
    • Electrical and optical properties of GaSe thin films
    • M. Ohyama Electrical and optical properties of GaSe thin films J Mater Sci Technol 13 1997 299 301 (Pubitemid 127759764)
    • (1997) Journal of Materials Science and Technology , vol.13 , Issue.4 , pp. 299-301
    • Ohyama, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.