XPS study of InTe and GaTe single crystals oxidation

Materials Chemistry and Physics

Volumn 97, Issue 1, 2006, Pages 98-101

  Balitskii, O A ^a   Jaegermann, W ^b  

^a IVAN FRANKO NATIONAL UNIVERSITY OF LVIV   (Ukraine)

^b DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

Indium and gallium tellurides; Oxidation; X ray photo emission spectroscopy (XPS)

Indexed keywords

GALLIUM COMPOUNDS; INDIUM COMPOUNDS; OXIDATION; SELENIUM COMPOUNDS; TELLURIUM COMPOUNDS; X RAY PHOTOELECTRON SPECTROSCOPY;

GALLIUM SULPHIDES; INDIUM AND GALLIUM TELLURIDES; TELLURIUM OXIDES; THERMAL OXIDATION;

SINGLE CRYSTALS;

EID: 33644677560     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchemphys.2005.07.055     Document Type: Article

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