Statistical consequences of applying a PCA noise filter on EELS spectrum images

Ultramicroscopy

Volumn 125, Issue , 2013, Pages 35-42

  Lichtert, Stijn ^a   Verbeeck, Jo ^a  

^a UNIVERSITY OF ANTWERP   (Belgium)

Author keywords

Cram r Rao lower bound; EELS; Principal component analysis; Spectrum imaging

Indexed keywords

AMOUNT OF INFORMATION; BACKGROUND SUBTRACTION METHOD; DATA SETS; EELS SPECTRA; ELECTRON ENERGY LOSS; ELEMENTAL MAPS; ESTIMATED PARAMETER; EVALUATION CRITERIA; FILTERING PROCESS; LEAST SQUARES FITTING; LOWER BOUNDS; NOISE FILTERING; NOISE FILTERS; NOISE LEVELS; NOISY DATA; PHANTOM DATA; REMOVE NOISE; SINGULAR VALUES; SPECTRAL DATA; SPECTRUM IMAGES; SPECTRUM IMAGING; STATISTICAL CONSEQUENCES;

ENERGY DISSIPATION; PARAMETER ESTIMATION; PRINCIPAL COMPONENT ANALYSIS; SPURIOUS SIGNAL NOISE;

ELECTRON ENERGY LOSS SPECTROSCOPY;

ACCURACY; ARTICLE; ARTIFACT REDUCTION; DIGITAL FILTERING; ELECTRON ENERGY LOSS SPECTROSCOPY; IMAGE ANALYSIS; IMAGE RETRIEVAL; IMAGE SUBTRACTION; NOISE REDUCTION; POISSON DISTRIBUTION; PRINCIPAL COMPONENT ANALYSIS; SCORING SYSTEM; SIGNAL NOISE RATIO; SYSTEMATIC ERROR;

EID: 84871755029     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2012.10.001     Document Type: Article

References (33)

1. Batson P.E., Dellby N., Krivanek O.L. Nature 2002, 418:617-620.
2. Okunishi E., Sawada H., Kondo Y., Kersker M. Microscopy and Microanalysis 2006, 12(S2):1150-1151.
3. Botton G.A., Lazar S., Dwyer C. Ultramicroscopy 2010, 110(8):926-934.
4. Suenaga K., Koshino M. Nature 2010, 468:1088-1090.
5. Varela M., Oxley M., Luo W., Tao J., Watanabe M., Lupini A., Pantelides S., Pennycook S. Physical Review B 2009, 79:085117.
6. Shah A.B., Ramasse Q.M., Zhai X., Wen J.G., May S.J., Petrov I., Bhattacharya A., Abbamonte P., Eckstein J.N., Zuo J.-M. Advanced Materials 2010, 22:1156-1160.
7. Tan H., Turner S., Yücelen E., Verbeeck J., Van Tendeloo G. Physical Review Letters 2011, 107:107602.
8. Turner S., Lazar S., Freitag B., Egoavil R., Verbeeck J., Put S., Strauven Y., Van Tendeloo G. Nanoscale 2011.
9. Muller D.A., Fitting Kourkoutis L., Murfitt M., Song J.H., Hwang H.Y., Silcox J., Dellby N., Krivanek O.L. Science 2008, 319(5866):1073-1076.
10. Muller D.A. Nature Materials 2009, 8(4):263-270.
11. Varela M., Findlay S., Lupini a., Christen H., Borisevich A., Dellby N., Krivanek O., Nellist P., Oxley M., Allen L., Pennycook S. Physical Review Letters 2004, 92:095502.
12. C. Colliex, Journal of Electron Microscopy 60 Suppl 1 (2011) S161-S171 .
13. Botton G.A. MRS Bulletin 2012, 37:21-28.
14. Egerton R. Electron Energy-Loss Spectroscopy in the Electron Microscope 2011, Springer, New York. third edition.
15. Trebbia P., Bonnet N. Ultramicroscopy 1990, 34:165-178.
16. Bonnet N. Ultramicroscopy 1999, 77(3-4):97-112.
17. Keenan M.R., Kotula P.G. Surface and Interface Analysis 2004, 36:203-212.
18. Burke M.G., Watanabe M., Williams D.B., Hyde J.M. Journal of Materials Science 2006, 41:4512-4522.
19. Bosman M., Keast V., García-Muñoz J., D'Alfonso A., Findlay S., Allen L. Physical Review Letters 2007, 99:086102.
20. García-Barriocanal J., Bruno F.Y., Rivera-Calzada A., Sefrioui Z., Nemes N.M., Garcia-Hernández M., Rubio-Zuazo J., Castro G.R., Varela M., Pennycook S.J., Leon C., Santamaria J. Advanced Materials 2010, 22:627-632.
21. Trasobares S., López-Haro M., Kociak M., March K., de La Peña F., Perez-Omil J.a., Calvino J.J., Lugg N.R., D'Alfonso A.J., Allen L.J., Colliex C. Angewandte Chemie 2011, 123:898-902.
22. Dudeck K.J., Couillard M., Lazar S., Dwyer C., Botton G.a. Micron 2012, 43:57-67.
23. Pennycook T.J., Oxley M.P., Garcia-Barriocanal J., Bruno F.Y., Leon C., Santamaria J., Pantelides S.T., Varela M., Pennycook S.J. European Physical Journal-Applied Physics 2011, 54:33507.
24. Cueva P., Hovden R., Mundy J.A., Xin H.L., Muller D.A. Microscopy and Microanalysis 2012, 18:667-675.
25. Krivanek O.L., Chisholm M.F., Nicolosi V., Pennycook T.J., Corbin G.J., Dellby N., Murfitt M.F., Own C.S., Szilagyi Z.S., Oxley M.P., Pantelides S.T., Pennycook S.J. Nature 2010, 464:571-574.
26. Verbeeck J., Bertoni G. Ultramicroscopy 2009, 109:1343-1352.
27. Malinowski E.R. Factor Analysis in Chemistry 1991, Wiley-Interscience. 2nd edition.
28. Jolliffe I.T. Principal Component Analysis 2002, Springer-Verlag, New York. second ed.
29. Faber N.M., Meinders M.J., Geladi P., Sjöström M., Buydens L.M.C., Kateman G. Analytica Chimica Acta 1995, 304:257-271.
30. Verbeeck J., Van Aert S. Ultramicroscopy 2004, 101:207-224.
31. Lozano-Perez S., de Castro Bernal V., Nicholls R.J. Ultramicroscopy 2009, 109:1217-1228.
32. Levina E., Wagaman A.S., Callender A.F., Mandair G.S., Morris M.D. Journal of Chemometrics 2007, 21:24-34.
33. Frieden B.R. Science from Fisher Information. A Unification 2004, Cambridge University Press.