메뉴 건너뛰기




Volumn 60, Issue 1, 2013, Pages 391-395

Self-selection unipolar HfOx-Based RRAM

Author keywords

Bipolar; high resistance switching (HRS); low resistance switching (LRS); resistive switching (RS); unipolar

Indexed keywords

BIPOLAR; HIGH RESISTANCE; LOW RESISTANCE; RESISTIVE SWITCHING; UNIPOLAR;

EID: 84871731270     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2012.2223821     Document Type: Article
Times cited : (36)

References (19)
  • 1
    • 35748974883 scopus 로고    scopus 로고
    • Nanoionics-based resistive switching memories
    • DOI 10.1038/nmat2023, PII NMAT2023
    • R. Waser and M. Aono, "Nanoionics-based resistive switching memories, " Nat. Mater., vol. 6, no. 11, pp. 833-840, Nov. 2007. (Pubitemid 350064191)
    • (2007) Nature Materials , vol.6 , Issue.11 , pp. 833-840
    • Waser, R.1    Aono, M.2
  • 4
    • 77950277801 scopus 로고    scopus 로고
    • Rewritable switching of one diode-one resistor nonvolatile organic memory devices
    • Mar.
    • B. Cho, T.-W. Kim, S. Song, Y. Ji, M. Jo, H. Wang, G.-Y. Jung, and T. Lee, "Rewritable switching of one diode-one resistor nonvolatile organic memory devices, " J. Adv. Mater., vol. 22, no. 11, pp. 1228-1232, Mar. 2010.
    • (2010) J. Adv. Mater , vol.22 , Issue.11 , pp. 1228-1232
    • Cho, B.1    Kim, T.-W.2    Song, S.3    Ji, Y.4    Jo, M.5    Wang, H.6    Jung, G.-Y.7    Lee, T.8
  • 5
    • 38849155969 scopus 로고    scopus 로고
    • Control of resistance switching voltages in rectifying Pt/TiOx/Pt trilayer
    • Jan
    • H. Shima, F. Takano, H. Muramatsu, H. Akinaga, I. H. Inoue, and H. Takagi, "Control of resistance switching voltages in rectifying Pt/TiOx/Pt trilayer, " Appl. Phys. Lett., vol. 92, no. 4, pp. 043510-1-043510-3, Jan. 2008.
    • (2008) Appl. Phys. Lett , vol.92 , Issue.4 , pp. 0435101-0435103
    • Shima, H.1    Takano, F.2    Muramatsu, H.3    Akinaga, H.4    Inoue, I.H.5    Takagi, H.6
  • 6
    • 70350104940 scopus 로고    scopus 로고
    • Self-rectifying effect in gold nanocrystal-embedded zirconium oxide resistive memory
    • Oct
    • Q. Zuo, S. Long, Q. Liu, S. Zhang, Q. Wang, Y. Li, Y. Wang, and M. Liu, "Self-rectifying effect in gold nanocrystal-embedded zirconium oxide resistive memory, " J. Appl. Phys., vol. 106, no. 7, pp. 073724-1-073724-5, Oct. 2009.
    • (2009) J. Appl. Phys , vol.106 , Issue.7 , pp. 0737241-0737245
    • Zuo, Q.1    Long, S.2    Liu, Q.3    Zhang, S.4    Wang, Q.5    Li, Y.6    Wang, Y.7    Liu, M.8
  • 8
    • 79958058204 scopus 로고    scopus 로고
    • Diode-less nano-scale ZrOx/HfOx RRAM device with excellent switching uniformity and reliability for high-density crosspoint memory applications
    • J. Lee, J. Shin, D. Lee, W. Lee, S. Jung, M. Jo, J. Park, K. P. Biju, S. S. Kim, and H. Park, "Diode-less nano-scale ZrOx/HfOx RRAM device with excellent switching uniformity and reliability for high-density crosspoint memory applications, " in IEDM Tech. Dig., 2010, pp. 452-455.
    • (2010) IEDM Tech. Dig , pp. 452-455
    • Lee, J.1    Shin, J.2    Lee, D.3    Lee, W.4    Jung, S.5    Jo, M.6    Park, J.7    Biju, K.P.8    Kim, S.S.9    Park, H.10
  • 9
    • 77951622926 scopus 로고    scopus 로고
    • Complementary resistive switches for passive nanocrossbar memories
    • May
    • E. Linn, R. Rosezin, C. Kuegeler, and R. Waser, "Complementary resistive switches for passive nanocrossbar memories, " Nat. Mater., vol. 9, no. 5, pp. 403-406, May 2010.
    • (2010) Nat. Mater , vol.9 , Issue.5 , pp. 403-406
    • Linn, E.1    Rosezin, R.2    Kuegeler, C.3    Waser, R.4
  • 11
    • 79951951303 scopus 로고    scopus 로고
    • A high yield HfOx based unipolar resistive RAM employing Ni electrode compatible with Si-diode selector for cross-bar integration
    • Mar.
    • X. A. Tran, H. Y. Yu, Y. C. Yeo, L. Wu, W. L. Liu, Z. R. Wang, Z. Fang, K. L. Pey, X. W. Sun, A. Y. Du, B. Y. Nguyen, and M. F. Li, "A high yield HfOx based unipolar resistive RAM employing Ni electrode compatible with Si-diode selector for cross-bar integration, " IEEE Electron Device Lett., vol. 32, no. 3, pp. 396-398, Mar. 2011.
    • (2011) IEEE Electron Device Lett , vol.32 , Issue.3 , pp. 396-398
    • Tran, X.A.1    Yu, H.Y.2    Yeo, Y.C.3    Wu, L.4    Liu, W.L.5    Wang, Z.R.6    Fang, Z.7    Pey, K.L.8    Sun, X.W.9    Du, A.Y.10    Nguyen, B.Y.11    Li, M.F.12
  • 13
    • 44849117666 scopus 로고    scopus 로고
    • Fundamental analysis of resistive nanocrossbars for the use in hybrid nano/CMOS-memory
    • A. Flocke and T. G. Noll, "Fundamental analysis of resistive nanocrossbars for the use in hybrid nano/CMOS-memory, " in Proc. 33rd ESSCIRC, 2007, pp. 328-331.
    • (2007) Proc. 33rd ESSCIRC , pp. 328-331
    • Flocke, A.1    Noll, T.G.2
  • 15
    • 70549106464 scopus 로고    scopus 로고
    • Unified physical model of bipolar oxide-based resistive switching memory
    • Dec
    • B. Gao, B. Sun, H. Zhang, L. Liu, X. Liu, R. Han, J. F. Kang, and B. Yu, "Unified physical model of bipolar oxide-based resistive switching memory, " IEEE Electron Device Lett., no. 12, pp. 1326-1328, Dec. 2009.
    • (2009) IEEE Electron Device Lett , Issue.12 , pp. 1326-1328
    • Gao, B.1    Sun, B.2    Zhang, H.3    Liu, L.4    Liu, X.5    Han, R.6    Kang, J.F.7    Yu, B.8
  • 18
    • 84856981036 scopus 로고    scopus 로고
    • Conduction mechanism of TiN \ HfOx \ Pt resistive switching memory: A trap-assisted-tunneling model
    • Aug.
    • S. Yu, X. Guan, and H. S. P. Wong, "Conduction mechanism of TiN \ HfOx \ Pt resistive switching memory: A trap-assisted-tunneling model, " Appl. Phys. Lett., vol. 99, no. 6, pp. 063507-1-063507-3, Aug. 2011.
    • (2011) Appl. Phys. Lett , vol.99 , Issue.6 , pp. 0635071-0635073
    • Yu, S.1    Guan, X.2    Wong, H.S.P.3
  • 19
    • 84655161271 scopus 로고    scopus 로고
    • Resistive switching in HfO2 probed by a metal-insulator-semiconductor bipolar transistor
    • Jan.
    • E. Yalon, A. Gavrilov, S. Cohen, D. Mistele, B. Meyler, J. Salzman, and D. Ritter, "Resistive switching in HfO2 probed by a metal-insulator- semiconductor bipolar transistor, " IEEE Electron Device Lett., vol. 33, no. 1, pp. 11-13, Jan. 2011.
    • (2011) IEEE Electron Device Lett , vol.33 , Issue.1 , pp. 11-13
    • Yalon, E.1    Gavrilov, A.2    Cohen, S.3    Mistele, D.4    Meyler, B.5    Salzman, J.6    Ritter, D.7


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.