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Volumn 101, Issue 25, 2012, Pages

Strain relaxation in GaN nanopillars

(8) Tseng, W J a,b Gonzalez, M a Dillemans, L b Cheng, K a Jiang, S J a,b Vereecken, P M a,b Borghs, G a,b Lieten, R R a,b

a IMEC (Belgium)

b UNIVERSITY OF LEUVEN (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

DIRECT MEASUREMENT; EXPONENTIAL RELAXATION; HIGHLY STRAINED; NANOPILLARS; SINGLE RELAXATION; STRAIN STATE;

GALLIUM NITRIDE; STRAIN RELAXATION; X RAY DIFFRACTION;

NANOSTRUCTURES;

EID: 84871725195 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.4772481 Document Type: Article

Times cited : (23)

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