X-ray in-plane scattering investigation of GaN nanorods

Journal of Applied Physics

Volumn 104, Issue 10, 2008, Pages

  Horak L ^a   Hol, V ^a   Staddon, C R ^b   Farley, N R S ^b   Novikov, S V ^b   Campion, R P ^b   Foxon, C T ^b  

^a CHARLES UNIVERSITY   (Czech Republic)

^b UNIVERSITY OF NOTTINGHAM   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVES; EPITAXIAL GROWTH; GALLIUM ALLOYS; GALLIUM NITRIDE; SEMICONDUCTING GALLIUM;

CRYSTALLINE SUBSTRATES; GAN NANORODS; LABORATORY EQUIPMENTS; MEAN SIZES; RAPID CHARACTERIZATIONS; SCANNING ELECTRONS; SET-UPS; STRUCTURE CHARACTERIZATIONS; X-RAY METHODS;

NANORODS;

EID: 57049162477     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3021090     Document Type: Article

References (5)

1. D. Cherns, L. Meshi, I. Griffiths, S. Khongphetsak, S. V. Novikov, N. Farley, R. P. Campion, and C. T. Foxon, Appl. Phys. Lett. 0003-6951 10.1063/1.2899944 92, 121902 (2008).
2. B. Mandl, J. Stangl, T. Mrtensson, A. Mikkelsen, J. Eriksson, L. S. Karlsson, G. Bauer, L. Samuelson, and W. Seifert, Nano Lett. 1530-6984 10.1021/nl060452v 6, 1817 (2006).
3. J. Eymery, F. Rieutord, V. Favre-Nicolin, O. Robach, Y. Niquet, L. Fröberg, T. Mrtensson, and L. Samuelson, Nano Lett. 7, 2596 (2007). 1530-6984
4. J. Als-Nielsen and D. McMorrow, Elements of Modern X-Ray Physics (Wiley, New York, 2001).
5. U. Pietsch, V. Hol, and T. Baumbach, High-Resolution X-Ray Scattering: From Thin Films and Lateral Nanostructures (Springer, Berlin, 2003).