Electrical and structural analyses of solution-processed li-doped ZnO thin film transistors exposed to ambient conditions

Applied Physics Express

Volumn 6, Issue 1, 2013, Pages

  Kang, Tae Sung ^a   Koo, Ja Hyun ^a   Kim, Tae Yoon ^a   Hong, Jin Pyo ^a  

^a Hanyang University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

AMBIENT CONDITIONS; CHEMICAL SOLUTIONS; DOPING PROCESS; LI-DOPANTS; LOW TEMPERATURES; NEGATIVE SHIFT; OFF-CURRENT; REDUCTION OF OXYGEN; SECOND ORDERS; SECONDARY ION MASS SPECTROSCOPY; SOLUTION-PROCESSED; STRUCTURAL FEATURE; THIN-FILM TRANSISTOR (TFTS); TIME-DEPENDENT; TRANSFER CURVES; ZNO;

PHOTOELECTRONS; SECONDARY ION MASS SPECTROMETRY; THIN FILM TRANSISTORS; X RAY PHOTOELECTRON SPECTROSCOPY; ZINC OXIDE;

DOPING (ADDITIVES);

EID: 84871533752     PISSN: 18820778     EISSN: 18820786     Source Type: Journal    
DOI: 10.7567/APEX.6.011101     Document Type: Article

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