Analysis of correlation between electrical and infrared optical properties of anatase Nb doped TiO2 films

Current Applied Physics

Volumn 13, Issue 3, 2013, Pages 556-561

  Su, Weitao ^a   Song, Kaixin ^a   Huo, Dexuan ^a   Li, Bin ^b  

^a HANGZHOU DIANZI UNIVERSITY   (China)

^b SHANGHAI INSTITUTE OF TECHNICAL PHYSICS   (China)

Author keywords

Anatase Nb:TiO2 films; Electrical inhomogeneity; Ellipsometry; Infrared reflection

Indexed keywords

DOPED-TIO; ELECTRICAL ANALYSIS; EXPONENTIAL MODELS; FOURIER; FTIR; INFRARED OPTICAL PROPERTIES; INFRARED REFLECTIONS; INFRARED TRANSMISSION SPECTRA; INHOMOGENEITIES; IR REFLECTION; NB DOPING; PULSE LASER DEPOSITION; SCATTERING TIME; TRANSPARENT CONDUCTIVE OXIDES;

CONDUCTIVE FILMS; ELECTRIC PROPERTIES; ELLIPSOMETRY; FOURIER TRANSFORM INFRARED SPECTROSCOPY; OPTICAL CONSTANTS; OPTICAL PROPERTIES; OXIDE FILMS; SEMICONDUCTOR DOPING; SPECTROSCOPIC ELLIPSOMETRY;

TITANIUM DIOXIDE;

EID: 84871362900     PISSN: 15671739     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cap.2012.10.004     Document Type: Article

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