A dynamic model of the jump-to phenomenon during AFM analysis

Langmuir

Volumn 28, Issue 50, 2012, Pages 17273-17286

  Bowen, James ^a   Cheneler, David ^a  

^a UNIVERSITY OF BIRMINGHAM   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; AFM TIP; ATOMIC FORCE MICROSCOPE (AFM); ATOMIC FORCE MICROSCOPE CANTILEVERS; CANTILEVER TIP; DYNAMIC PHENOMENA; LENGTH SCALE; MICRO-CANTILEVERS; MICRO-RHEOMETERS; NANO SCALE; SOFT MATERIAL; SOFTER MATERIALS; SPHERICAL COLLOIDS; SURFACE INTERACTIONS; THEORETICAL MODELS; YOUNG'S MODULUS;

AIR; DIGITAL STORAGE; DYNAMICS; ELASTIC MODULI; ELASTOHYDRODYNAMIC LUBRICATION; MATERIALS PROPERTIES; NANOCANTILEVERS; SUBSTRATES; SURFACES; VAN DER WAALS FORCES;

ATOMIC FORCE MICROSCOPY;

EID: 84871333422     PISSN: 07437463     EISSN: 15205827     Source Type: Journal    
DOI: 10.1021/la304009c     Document Type: Article

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