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Volumn 67, Issue 1-4, 1998, Pages 291-305

The Interaction between Micrometer-size Particles and Flat Substrates: A Quantitative Study of Jump-to-Contact

Author keywords

Atomic force microscope (AFM); Jump to contact; Particle adhesion; Surface force interaction

Indexed keywords


EID: 0000900859     PISSN: 00218464     EISSN: None     Source Type: Journal    
DOI: 10.1080/00218469808011113     Document Type: Article
Times cited : (39)

References (15)
  • 7
    • 85138055051 scopus 로고
    • Adhesion of charged particles
    • D. S. Rimai, L. P. DeMejo and K. L. Mittal, Eds. VSP, Utrecht
    • Hays, D. A., "Adhesion of charged particles", in Fundamentals of Adhesion and Interfaces D. S. Rimai, L. P. DeMejo and K. L. Mittal, Eds. (VSP, Utrecht, 1995), pp. 61-71.
    • (1995) Fundamentals of Adhesion and Interfaces , pp. 61-71
    • Hays, D.A.1
  • 9
    • 0542409879 scopus 로고    scopus 로고
    • Available from Park Scientific Instruments, Sunnyvale, CA 94089, USA
    • Available from Park Scientific Instruments, Sunnyvale, CA 94089, USA.
  • 15
    • 85138048436 scopus 로고
    • Mechanics of particle adhesion
    • D. S. Rimai, L. P. DeMejo and K. L. Mittal, Eds. VSP, Utrecht
    • Rimai, D. S., DeMejo, L. P. and Bowen, R. C., "Mechanics of particle adhesion", in Fundamentals of Adhesion and Interfaces, D. S. Rimai, L. P. DeMejo and K. L. Mittal, Eds. (VSP, Utrecht, 1995), pp. 1-23.
    • (1995) Fundamentals of Adhesion and Interfaces , pp. 1-23
    • Rimai, D.S.1    DeMejo, L.P.2    Bowen, R.C.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.