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Journal of Applied Physics

Volumn 112, Issue 10, 2012, Pages

Fundamental properties of field emission-driven direct current microdischarges

(2) Rumbach, Paul a Go, David B a

a University of Notre Dame (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPLIED VOLTAGES; APPROXIMATE ANALYTIC SOLUTIONS; COMPUTATIONAL RESULTS; CRITICAL ION DENSITY; CURRENT-VOLTAGE RELATIONS; DIRECT CURRENT; FUNDAMENTAL PROPERTIES; GAP SIZE; ION CONCENTRATIONS; ION DENSITY; IONIZING COLLISIONS; MATHEMATICAL FORMS; MICRODISCHARGES; ONE-DIMENSIONAL FLUID MODEL; PLASMA PROPERTIES; PREBREAKDOWN; SCALING ANALYSIS; SECONDARY EMISSION COEFFICIENTS;

ELECTRIC FIELDS; FIELD EMISSION; IONS; POISSON EQUATION;

FIELD EMISSION CATHODES;

EID: 84870687126 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.4764344 Document Type: Article

Times cited : (69)

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