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Volumn 16, Issue 1, 2009, Pages

Field emission and lifetime of microcavity plasma

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC DISCHARGES; ELECTRIC FIELD EFFECTS; ELECTRIC FIELDS; EROSION; FIELD EMISSION; IONS; PLASMA DENSITY; PLASMA JETS; PLASMAS; SOIL MECHANICS; SPUTTERING; SURFACE DISCHARGES; TWO DIMENSIONAL;

EID: 59449108868     PISSN: 1070664X     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3068745     Document Type: Article
Times cited : (6)

References (40)
  • 8
    • 59449086893 scopus 로고    scopus 로고
    • in Proceedings of the IEEE 33rd International Conference on Plasma Science (ICOPS), Traverse City, MI,.
    • S. -J. Park, J. D. Readle, A. Y. Chang, L. Z. Hua, K. S. Kim, and J. G. Eden, in Proceedings of the IEEE 33rd International Conference on Plasma Science (ICOPS), Traverse City, MI, 2006, p. 360.
    • (2006) , pp. 360
    • Park, S.-J.1    Readle, J.D.2    Chang, A.Y.3    Hua, L.Z.4    Kim, K.S.5    Eden, J.G.6
  • 38
    • 59449102658 scopus 로고    scopus 로고
    • SRIM software can be found at the.
    • SRIM software can be found at the http://www.srim. org.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.