Analysis of Kikuchi band contrast reversal in electron backscatter diffraction patterns of silicon

Ultramicroscopy

Volumn 110, Issue 3, 2010, Pages 190-194

  Winkelmann, Aimo ^a   Nolze, Gert ^b  

^a MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

^b BAM FEDERAL INSTITUTE FOR MATERIALS RESEARCH AND TESTING   (Germany)

Author keywords

Dynamical electron diffraction simulation; Electron backscatter diffraction; Kikuchi patterns

Indexed keywords

BACKSCATTERING; ELECTRONS; INELASTIC SCATTERING; SILICON;

ANOMALOUS ABSORPTION; BACKSCATTERED ELECTRONS; DIFFRACTION CALCULATIONS; DIFFRACTION SIMULATION; ELECTRON BACK SCATTER DIFFRACTION; EXPERIMENTAL CONDITIONS; KIKUCHI PATTERNS; PRIMARY BEAM ENERGIES;

ELECTRON DIFFRACTION;

SILICON;

ARTICLE; CONTROLLED STUDY; CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; DISPERSION; ELECTRON BACKSCATTER DIFFRACTION; ELECTRON BEAM; ELECTRON DIFFRACTION; MOLECULAR MECHANICS; SIMULATION; THICKNESS;

EID: 75849160269     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2009.11.008     Document Type: Article

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