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Volumn 102, Issue 1, 2004, Pages 23-26
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Location specific in situ TEM straining specimens made using FIB
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Author keywords
Focused ion beam; In situ straining; Transmission electron microscopy
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Indexed keywords
ELECTRON BACKSCATTERED DIFFRACTION (EBSD);
FOCUSED ION BEAMS (FIB);
IN SITU TENSILE STRAINING;
POLISHED SURFACES;
BACKSCATTERING;
ELECTRON DIFFRACTION;
IN SITU PROCESSING;
ION BEAMS;
MICROSTRUCTURE;
POLISHING;
STRAIN;
SUBSTRATES;
SURFACE TREATMENT;
TRANSMISSION ELECTRON MICROSCOPY;
ANALYTIC METHOD;
ARTICLE;
FEASIBILITY STUDY;
INSTRUMENTATION;
TRANSMISSION ELECTRON MICROSCOPY;
ALLOYS;
MATERIALS TESTING;
MICROSCOPY, ELECTRON, TRANSMISSION;
SPECIMEN HANDLING;
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EID: 8844285954
PISSN: 03043991
EISSN: None
Source Type: Journal
DOI: 10.1016/j.ultramic.2004.08.002 Document Type: Article |
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Times cited : (30)
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References (1)
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