Application of a novel EBSD-FIB method to the transmission of c + a dislocations through α/β interfaces Ti-6Al-4V for producing in situ tension transmission electron microscopy specimens

Journal of Electron Microscopy

Volumn 61, Issue 1, 2012, Pages 31-36

  Ding, R ^a   Chiu, Y ^a   Jones, I P ^a   Escale N ^b   Pettinari Sturmel, F ^b   Douin, J ^b  

^a UNIVERSITY OF BIRMINGHAM   (United Kingdom)

^b CEMES CNRS   (France)

Author keywords

electron backscattered diffraction; focussed ion beam; in situ straining; transmission electron microscopy

Indexed keywords

ELECTRON DIFFRACTION; ELECTRONS; ION BEAMS; PHASE INTERFACES;

DISLOCATION BEHAVIORS; DUAL-BEAM; ELECTRON BACK-SCATTERED DIFFRACTION; FOCUSSED ION-BEAMS; IN-SITU STRAINING; IN-SITU TENSION; ION BEAM MICROSCOPE; NOVEL METHODS; SAMPLE AREAS; TRANSMISSION ELECTRON;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

EID: 84856877310     PISSN: 00220744     EISSN: 14779986     Source Type: Journal    
DOI: 10.1093/jmicro/dfr077     Document Type: Article

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