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Anomaly and defects characterization by i-v and current deep level transient spectroscopy of al0. 25ga0. 75n/gan/sic high electron-mobility transistors
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S. Saadaoui, M. Mongi B. Salem, M. Gassoumi, H. Maaref, and C. Gaquiére , "Anomaly and defects characterization by I-V and current deep level transient spectroscopy of Al0. 25Ga0. 75N/GaN/SiC high electron-mobility transistors, " J. Appl. Phys. Vol 111, 073713, 2012.
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