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Advanced Functional Materials

Volumn 22, Issue 23, 2012, Pages 5044-5049

Probing individual layers in functional oxide multilayers by wavelength-dependent raman scattering

(6) Kreisel, Jens a,b,c Weber, Mads C b Dix, Nico d Sánchez, Florencio d Thomas, Pamela A b Fontcuberta, Josep d

a LABORATOIRE DES MATÉRIAUX ET DU GÉNIE PHYSIQUE (France)

b UNIVERSITY OF WARWICK (United Kingdom)

c LUXEMBOURG INSTITUTE OF SCIENCE AND TECHNOLOGY (Luxembourg)

d INSTITUT DE CIÈNCIA DE MATERIALS DE BARCELONA ICMAB CSIC (Spain)

Author keywords

functional oxides; heterostructures; Raman scattering; strain; thin film multilayers

Indexed keywords

BATIO; EXPERIMENTAL OBSERVATION; FUNCTIONAL OXIDES; INDIVIDUAL COMPONENTS; INTERFACE COUPLINGS; LASER WAVELENGTH; NON DESTRUCTIVE; RAMAN SIGNATURES; STRAIN STATE; STRUCTURE AND PROPERTIES; STRUCTURE CHANGE; THIN-FILM STRUCTURE;

HETEROJUNCTIONS; INTERFACE STATES; RAMAN SCATTERING; SILICON; STRAIN; WAVELENGTH;

MULTILAYERS;

EID: 84870613221 PISSN: 1616301X EISSN: 16163028 Source Type: Journal
DOI: 10.1002/adfm.201201272 Document Type: Article

Times cited : (37)

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