Raman study of BaFe12O19 thin films

Applied Physics Letters

Volumn 73, Issue 9, 1998, Pages 1194-1196

  Kreisel, J ^a   Pignard, S ^a   Vincent, H ^a   Senateur J P ^a   Lucazeau, G ^b  

^a LABORATOIRE DES MATÉRIAUX ET DU GÉNIE PHYSIQUE   (France)

^b LEPMI   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000229945     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.122124     Document Type: Article

References (26)

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