Ferroelectricity in ultrathin BaTiO3 films: Probing the size effect by ultraviolet raman spectroscopy

Physical Review Letters

Volumn 103, Issue 17, 2009, Pages

  Tenne, D A ^a   Turner, P ^a   Schmidt, J D ^a   Biegalski, M ^b,f   Li, Y L ^b,c   Chen, L Q ^b   Soukiassian, A ^b   Trolier Mckinstry, S ^b   Schlom, D G ^b,g   Xi, X X ^b   Fong, D D ^d   Fuoss, P H ^d   Eastman, J A ^d   Stephenson, G B ^d   Thompson, C ^e   Streiffer, S K ^d  

^a BOISE STATE UNIVERSITY   (United States)

^b PENNSYLVANIA STATE UNIVERSITY   (United States)

^c PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

^d ARGONNE NATIONAL LABORATORY   (United States)

^e NORTHERN ILLINOIS UNIVERSITY   (United States)

^f OAK RIDGE NATIONAL LABORATORY   (United States)

^g Department of Obstetrics Gynecology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FERROELECTRIC PHASE TRANSITION TEMPERATURES; PHASE-FIELD MODELS; RAMAN DATA; SIZE EFFECTS; SRTIO3 SUBSTRATES; SYNCHROTRON X-RAY SCATTERING; ULTRA-THIN; ULTRAVIOLET RAMAN SPECTROSCOPY; VARIABLE TEMPERATURE;

BARIUM TITANATE; FERROELECTRIC FILMS; FERROELECTRICITY; MAGNETIC FILMS; PHASE TRANSITIONS; RAMAN SCATTERING; RAMAN SPECTROSCOPY; ULTRATHIN FILMS;

TECHNETIUM;

EID: 70350236739     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.103.177601     Document Type: Article

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