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Volumn , Issue , 2009, Pages 1028-1033

A four degree of freedom microrobot with large work volume

Author keywords

[No Author keywords available]

Indexed keywords

AGRICULTURAL ROBOTS; DATA COMMUNICATION EQUIPMENT; DEGREES OF FREEDOM (MECHANICS); ELECTROSTATIC ACTUATORS; NANOTECHNOLOGY;

EID: 84870493375     PISSN: 10504729     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ROBOT.2009.5152812     Document Type: Conference Paper
Times cited : (12)

References (17)
  • 4
    • 33846070477 scopus 로고    scopus 로고
    • Microassembly of 3D MEMS structures utilizing micogripper with a robotic manipulator
    • N. Dechev, W. L. Cleghorn, J.K. Mills, "Microassembly of 3D MEMS Structures Utilizing Micogripper with a Robotic Manipulator," in Journal of Microelectromechanical Systems, Vol. 13, Pp:11-19, 2004.
    • (2004) Journal of Microelectromechanical Systems , vol.13 , pp. 11-19
    • Dechev, N.1    Cleghorn, W.L.2    Mills, J.K.3
  • 7
    • 32244432061 scopus 로고    scopus 로고
    • An untethered, electrostatic, globally-controllable MEMS micro-robot
    • B.R. Donald et al., "An Untethered, Electrostatic, Globally-Controllable MEMS Micro-Robot," Journal of Microelectromechanical Systems, Vol 15, No. 1, Pp 167-173, 2006.
    • (2006) Journal of Microelectromechanical Systems , vol.15 , Issue.1 , pp. 167-173
    • Donald, B.R.1
  • 10
    • 34249718527 scopus 로고    scopus 로고
    • Design, fabrication and testing of a silicon-on-insulator (SOI) MEMS parallel kinematics XY stage
    • J. Dong, D. Mukhopadhyay, P. M Ferreira, "Design, Fabrication and Testing of a Silicon-On-Insulator (SOI) MEMS Parallel Kinematics XY Stage," Journal of Micromech. Microeng," Vol 2, No. 17, Pp 1154-116, 2007.
    • (2007) Journal of Micromech. Microeng , vol.2 , Issue.17 , pp. 1154-2116
    • Dong, J.1    Mukhopadhyay, D.2    Ferreira, P.M.3
  • 11
    • 77953760382 scopus 로고    scopus 로고
    • Electrical nanoprobing of semiconducting carbon nanotubes using an atomic force microscope
    • J.Y. Park, Y. Yaish, M. Brink, S. Rosenblatt, P.L. McEuen, "Electrical Nanoprobing of Semiconducting Carbon Nanotubes using an Atomic Force Microscope," in Applied Physics Letters, Vol 80, Pp. 444-456, 2002.
    • (2002) Applied Physics Letters , vol.80 , pp. 444-456
    • Park, J.Y.1    Yaish, Y.2    Brink, M.3    Rosenblatt, S.4    McEuen, P.L.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.