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Volumn , Issue , 2012, Pages 286-291

Modeling distribution and impact of efficiency limiting metallic impurities in silicon solar cells

Author keywords

impurities; modeling; silicon; solar cells

Indexed keywords

AS PRECIPITATES; CARRIER RECOMBINATION; CELL EFFICIENCY; CELL PARAMETER; CELL SIMULATION; DIFFERENT SIZES; IMPURITY CONCENTRATION; METAL IMPURITIES; METALLIC IMPURITY; MODELING DISTRIBUTIONS; MODELING RESULTS; MULTI-CRYSTALLINE SILICON; QUANTITATIVE PREDICTION; SOLAR CELL PROCESSING;

EID: 84869431462     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2012.6317620     Document Type: Conference Paper
Times cited : (7)

References (15)
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    • SchOn, J.1    Habenicht, H.2    Warta, W.3    Schubert, M.C.4
  • 11
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    • Giesecke, J.A., M.C. Schubert, B. Michl, F. Schindler, and W. Warta, Minority carrier lifetime imaging of silicon wafers calibrated by quasi-steady-state photoluminescence. Solar Energy Materials and Solar Cells, 2011. 95(3): p. 1011-1018.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.