Role of copper in light induced minority-carrier lifetime degradation of silicon

Applied Physics Letters

Volumn 95, Issue 15, 2009, Pages

  Savin, H ^a   Yli Koski, M ^a   Haarahiltunen, A ^a  

^a AALTO UNIVERSITY   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER CONTAMINATION; CRYSTALLINE SILICON MATERIALS; DEGRADATION EFFECT; MINORITY CARRIER LIFETIMES;

BORON; BORON COMPOUNDS; COPPER; DEGRADATION; OXYGEN;

CARRIER LIFETIME;

EID: 70350068097     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3250161     Document Type: Article

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