메뉴 건너뛰기




Volumn 52, Issue 11, 2012, Pages 2685-2689

Synthesis of Au-Sn alloy nanoparticles for lead-free electronics with unique combination of low and high melting temperatures

Author keywords

[No Author keywords available]

Indexed keywords

AU-SN ALLOY; BULK STATE; CHEMICAL REDUCTION; CHEMICAL REDUCTION METHODS; ELECTRONIC COMPONENT; EUTECTIC POINTS; HEXAGONAL STRUCTURES; HIGH-TEMPERATURE ELECTRONICS; LEAD FREE ELECTRONICS; LEAD-FREE SOLDERING; MANUFACTURING PROCESS; MECHANICAL PERFORMANCE; MELTING TRANSITIONS; NANOSCALE RANGES; ROOM TEMPERATURE; SIZE RANGES; SOLDER ALLOYS; SOLDER JOINTS; SYNTHESIS METHOD;

EID: 84867583194     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2012.04.008     Document Type: Article
Times cited : (27)

References (36)
  • 31
    • 33748951191 scopus 로고    scopus 로고
    • 3Sn intermetallic compounds in Sn-Ag lead-free solder
    • 3Sn intermetallic compounds in Sn-Ag lead-free solder Chin Sci Bull 51 14 2006 1766 1770
    • (2006) Chin Sci Bull , vol.51 , Issue.14 , pp. 1766-1770
    • Shen, J.1    Liu, Y.C.2    Gao, H.X.3
  • 32
    • 84857359560 scopus 로고    scopus 로고
    • Development of SnAg-based lead free solders in electronics packaging
    • L. Zhang, C. He, Y. Guo, J. Han, Y. Zhang, and X. Wang Development of SnAg-based lead free solders in electronics packaging Microelectron Reliab 52 2012 559 578
    • (2012) Microelectron Reliab , vol.52 , pp. 559-578
    • Zhang, L.1    He, C.2    Guo, Y.3    Han, J.4    Zhang, Y.5    Wang, X.6
  • 34
    • 39149119686 scopus 로고    scopus 로고
    • A study of nanoparticles in Sn-Ag based lead free solders
    • M. Amagai A study of nanoparticles in Sn-Ag based lead free solders Microelectron Reliab 48 2008 1 16
    • (2008) Microelectron Reliab , vol.48 , pp. 1-16
    • Amagai, M.1
  • 35
    • 84867573826 scopus 로고    scopus 로고
    • Impact of thermal aging on the thermal fatigue durability and interfacial intermetallic compounds thickness in Pb-free solder joints
    • Berlin, Germany, September 13-16
    • Chauhan P, Mueller M, Osterman M, Pecht M. Impact of thermal aging on the thermal fatigue durability and interfacial intermetallic compounds thickness in Pb-free solder joints. In: Proceedings of electronics systems integration conferences (ESTC), Berlin, Germany, September 13-16, 2010.
    • (2010) Proceedings of Electronics Systems Integration Conferences (ESTC)
    • Chauhan, P.1    Mueller, M.2    Osterman, M.3    Pecht, M.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.