-
1
-
-
0038112030
-
-
I. Ohnuma, M. Miyashita, K. Anzai, J.X. Liu, H. Ohtani, and R. Kainuma IEEE Trans Electron Pack Manuf 26 2003 84
-
(2003)
IEEE Trans Electron Pack Manuf
, vol.26
, pp. 84
-
-
Ohnuma, I.1
Miyashita, M.2
Anzai, K.3
Liu, J.X.4
Ohtani, H.5
Kainuma, R.6
-
6
-
-
58149103701
-
-
Andersson C, Zou C, Yang B, Gao Y, Liu L, Zhae, Q. Electronics System-Integration Technology Conference, ESTC, 2008. p. 915-22.
-
(2008)
Electronics System-Integration Technology Conference, ESTC
, pp. 915-922
-
-
Andersson, C.1
Zou, C.2
Yang, B.3
Gao, Y.4
Liu, L.5
Zhae, Q.6
-
7
-
-
23944499529
-
-
K. Minagawa, H. Kakisawa, Y. Osawa, S. Takamori, and K. Halada Sci Technol Adv Mater 6 2005 325
-
(2005)
Sci Technol Adv Mater
, vol.6
, pp. 325
-
-
Minagawa, K.1
Kakisawa, H.2
Osawa, Y.3
Takamori, S.4
Halada, K.5
-
9
-
-
84867577280
-
-
[accessed Dec 1, 2009]
-
He A, Djurfors B, Akhlaghi S, Ivey DG, Pulse plating of gold-tin alloys for microelectronic and optoelectronic applications, 2002, < http://www.micralyne.com/newslyne/ausnpaper.pdf > [accessed Dec 1, 2009].
-
(2002)
Pulse Plating of Gold-tin Alloys for Microelectronic and Optoelectronic Applications
-
-
He, A.1
Djurfors, B.2
Akhlaghi, S.3
Ivey, D.G.4
-
12
-
-
84867578809
-
-
S. Pande, A. Kumar Sarkar, M. Basu, J. Subhra, A. Kumar Sinha, S. Sarkar, and M. Pradhan Langmuir 24 2008 899
-
(2008)
Langmuir
, vol.24
, pp. 899
-
-
Pande, S.1
Kumar Sarkar, A.2
Basu, M.3
Subhra, J.4
Kumar Sinha, A.5
Sarkar, S.6
Pradhan, M.7
-
13
-
-
0037532897
-
-
M. Guardy, E. Cottancin, M. Pellarin, J. Lemre, L. Arnaud, J.R. Huntzinger, J.L. Vialle, and M. Broyer Phys Rev B 67 2003 155409-1
-
(2003)
Phys Rev B
, vol.67
, pp. 155409-155411
-
-
Guardy, M.1
Cottancin, E.2
Pellarin, M.3
Lemre, J.4
Arnaud, L.5
Huntzinger, J.R.6
Vialle, J.L.7
Broyer, M.8
-
17
-
-
59149087414
-
-
M. Schrinner, M. Balluaff, Y. Talmon, Y. Kauffmann, J. Thun, and M. Moller Science 323 2009 617
-
(2009)
Science
, vol.323
, pp. 617
-
-
Schrinner, M.1
Balluaff, M.2
Talmon, Y.3
Kauffmann, Y.4
Thun, J.5
Moller, M.6
-
28
-
-
46749108371
-
-
A. Choubey, H. Yu, M. Osterman, M. Pecht, F. Yun, and L. Yonghong J Electron Mater 37 8 2008 1130
-
(2008)
J Electron Mater
, vol.37
, Issue.8
, pp. 1130
-
-
Choubey, A.1
Yu, H.2
Osterman, M.3
Pecht, M.4
Yun, F.5
Yonghong, L.6
-
30
-
-
84867580662
-
-
Choubey A, Wu L, Ganesan S, Pecht M, Leal A, Labanda G, et al. In: Proceeding of IMAPS international conference on high temperature electronics; 2006.
-
(2006)
Proceeding of IMAPS International Conference on High Temperature Electronics
-
-
Choubey, A.1
Wu, L.2
Ganesan, S.3
Pecht, M.4
Leal, A.5
Labanda, G.6
-
31
-
-
33748951191
-
3Sn intermetallic compounds in Sn-Ag lead-free solder
-
3Sn intermetallic compounds in Sn-Ag lead-free solder Chin Sci Bull 51 14 2006 1766 1770
-
(2006)
Chin Sci Bull
, vol.51
, Issue.14
, pp. 1766-1770
-
-
Shen, J.1
Liu, Y.C.2
Gao, H.X.3
-
32
-
-
84857359560
-
Development of SnAg-based lead free solders in electronics packaging
-
L. Zhang, C. He, Y. Guo, J. Han, Y. Zhang, and X. Wang Development of SnAg-based lead free solders in electronics packaging Microelectron Reliab 52 2012 559 578
-
(2012)
Microelectron Reliab
, vol.52
, pp. 559-578
-
-
Zhang, L.1
He, C.2
Guo, Y.3
Han, J.4
Zhang, Y.5
Wang, X.6
-
33
-
-
84867574502
-
-
Yoon JW, Chun HS, Koo JM, Jung SB. Design, Test, Integration and Packaging (DTIP) of MEMS/MOEMS; 2006.
-
(2006)
Design, Test, Integration and Packaging (DTIP) of MEMS/MOEMS
-
-
Yoon, J.W.1
Chun, H.S.2
Koo, J.M.3
Jung, S.B.4
-
34
-
-
39149119686
-
A study of nanoparticles in Sn-Ag based lead free solders
-
M. Amagai A study of nanoparticles in Sn-Ag based lead free solders Microelectron Reliab 48 2008 1 16
-
(2008)
Microelectron Reliab
, vol.48
, pp. 1-16
-
-
Amagai, M.1
-
35
-
-
84867573826
-
Impact of thermal aging on the thermal fatigue durability and interfacial intermetallic compounds thickness in Pb-free solder joints
-
Berlin, Germany, September 13-16
-
Chauhan P, Mueller M, Osterman M, Pecht M. Impact of thermal aging on the thermal fatigue durability and interfacial intermetallic compounds thickness in Pb-free solder joints. In: Proceedings of electronics systems integration conferences (ESTC), Berlin, Germany, September 13-16, 2010.
-
(2010)
Proceedings of Electronics Systems Integration Conferences (ESTC)
-
-
Chauhan, P.1
Mueller, M.2
Osterman, M.3
Pecht, M.4
-
36
-
-
85196962588
-
Impact of thermal aging on the growth of Cu-Sn intermetallic compounds in pb-free solder joints in 2512 resistors
-
Lake Buena Vista, Florida, USA, November 13-19
-
Chauhan P, Osterman M, Pecht M. Impact of thermal aging on the growth of Cu-Sn intermetallic compounds in pb-free solder joints in 2512 resistors. In: Proceedings of ASME 2009 international mechanical engineering congress and exposition (IMECE2009), Lake Buena Vista, Florida, USA, November 13-19.
-
Proceedings of ASME 2009 International Mechanical Engineering Congress and Exposition (IMECE2009)
-
-
Chauhan, P.1
Osterman, M.2
Pecht, M.3
|