Atomic imaging and spectroscopy of low-dimensional materials with interrupted periodicities

Journal of Electron Microscopy

Volumn 61, Issue 5, 2012, Pages 285-291

  Suenaga, Kazu ^a   Akiyama Hasegawa, Kotone ^a,b   Niimi, Yoshiko ^a   Kobayashi, Haruka ^a   Nakamura, Midori ^a   Liu, Zheng ^a   Sato, Yuta ^a   Koshino, Masanori ^a   Iijima, Sumio ^a,b  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b MEIJO UNIVERSITY   (Japan)

Author keywords

defects; EELS; graphene; low dimensional materials; STEM

Indexed keywords

BORON DERIVATIVE; BORON NITRIDE; GRAPHITE;

ATOMIC ABSORPTION SPECTROMETRY; ELECTRON ENERGY LOSS SPECTROSCOPY; IMAGE PROCESSING; INSTRUMENTATION; METABOLISM; METHODOLOGY; REVIEW; SCANNING TRANSMISSION ELECTRON MICROSCOPY;

BORON COMPOUNDS; GRAPHITE; IMAGE PROCESSING, COMPUTER-ASSISTED; MICROSCOPY, ELECTRON, SCANNING TRANSMISSION; SPECTROPHOTOMETRY, ATOMIC; SPECTROSCOPY, ELECTRON ENERGY-LOSS;

ATOMS; BORON NITRIDE; ELECTRON ENERGY LEVELS; ELECTRON SCATTERING; ELECTRONIC PROPERTIES; ENERGY DISSIPATION; GRAPHENE; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; III-V SEMICONDUCTORS; NANORIBBONS; POINT DEFECTS; SCANNING ELECTRON MICROSCOPY; TUNGSTEN COMPOUNDS;

ANNULAR DARK-FIELD IMAGING; ATOMIC IMAGING; ELECTRON ENERGY-LOSS SPECTROSCOPIES; FINE STRUCTURES; IDENTIFICATION OF INDIVIDUALS; LAYERED MATERIAL; LOW-DIMENSIONAL MATERIALS; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SINGLE-ATOMS; STEM;

ELECTRON ENERGY LOSS SPECTROSCOPY;

EID: 84867529281     PISSN: 00220744     EISSN: 14779986     Source Type: Journal    
DOI: 10.1093/jmicro/dfs054     Document Type: Review

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