Diffraction post-processing of 3D dislocation dynamics simulations for direct comparison with micro-beam Laue experiments

Materials Letters

Volumn 89, Issue , 2012, Pages 66-69

  Hofmann, Felix ^a   Keegan, Sinéad ^b   Korsunsky, Alexander M ^c  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^b NORTHEASTERN UNIVERSITY   (United States)

^c UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

Defects; Dislocation dynamics simulations; Synchrotron micro beam Laue diffraction

Indexed keywords

ANISOTROPIC BROADENING; ANISOTROPIC LATTICES; DISCRETE DISLOCATION DYNAMICS; DISLOCATION DYNAMICS SIMULATION; DISLOCATION STRUCTURES; ELASTIC STRAIN; LATTICE ROTATIONS; LAUE DIFFRACTION; LAUE REFLECTION; MICRO BEAMS; ORIENTATION EFFECT; PARADIS; PEAK SHAPES; POST PROCESSING; SINGLE GRAINS; SYNCHROTRON X RAYS;

ANISOTROPY; DEFECTS; EXPERIMENTS; GEOMETRY; X RAY DIFFRACTION;

THREE DIMENSIONAL COMPUTER GRAPHICS;

EID: 84867518477     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matlet.2012.08.052     Document Type: Article

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