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Volumn 24, Issue 1-2, 2010, Pages 279-287

Intragranular lattice misorientation mapping by synchrotron x-ray micro-beams: Laue vs energy-resolved laue vs monochromatic reciprocal space analysis

Author keywords

Dislocation substructure; Micro beam Laue diffraction; Reciprocal space mapping

Indexed keywords


EID: 77951553252     PISSN: 02179792     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0217979210064216     Document Type: Article
Times cited : (8)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.