Synchrotron based reciprocal space mapping and dislocation substructure analysis

Materials Letters

Volumn 63, Issue 12, 2009, Pages 1077-1081

  Hofmann, F ^a   Song, X ^a   Eve, S ^b   Collins, S P ^c   Korsunsky, A M ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

^b LABORATOIRE CRISMAT   (France)

^c DIAMOND LIGHT SOURCE LTD   (United Kingdom)

Author keywords

Characterisation methods; Crystal structure; Defects; Dislocation substructure; Reciprocal space map; X ray techniques

Indexed keywords

DISLOCATIONS (CRYSTALS); HETEROJUNCTIONS; PLASTIC DEFORMATION;

CHARACTERISATION METHODS; DISLOCATION DENSITIES; DISLOCATION SUBSTRUCTURE; RECIPROCAL SPACE MAP; RECIPROCAL SPACE MAPPINGS; SINGLE GRAINS; X- RAY DIFFRACTIONS; X-RAY TECHNIQUES;

CRYSTAL STRUCTURE;

EID: 62249168022     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matlet.2009.02.014     Document Type: Article

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