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Volumn 101, Issue 15, 2012, Pages

Localizing trapped charge carriers in NO 2 sensors based on organic field-effect transistors

(6) Andringa, Anne Marije a,b Christian Roelofs, W S b,c Sommer, Michael d,e Thelakkat, Mukundan d Kemerink, Martijn c De Leeuw, Dago M a,b

a UNIVERSITY OF GRONINGEN (Netherlands)

b PHILIPS RESEARCH LABORATORIES (Netherlands)

c EINDHOVEN UNIVERSITY OF TECHNOLOGY (Netherlands)

d UNIVERSITY OF BAYREUTH (Germany)

e UNIVERSITY OF FREIBURG (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESIVE TAPES; FIELD-EFFECT SENSOR; SCANNING KELVIN PROBE MICROSCOPY; TRAPPED ELECTRONS;

GATE DIELECTRICS; NITROGEN OXIDES; ORGANIC FIELD EFFECT TRANSISTORS; SENSORS;

SURFACE POTENTIAL;

EID: 84867517353 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.4758697 Document Type: Article

Times cited : (21)

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