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Journal of Materials Science: Materials in Electronics

Volumn 23, Issue 10, 2012, Pages 1864-1868

Large and uniform piezoresponse of BiFe 0.995W 0.005O 3 thin film annealed at 450 °c

(6) Zhang, Hongyan a Cheng, Ling a Jiang, Bo a Sun, Wen a Liu, Jingjing a Hu, Guangda a

a UNIVERSITY OF JINAN (China)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING TEMPERATURES; BIFE; CRYSTALLIZED FILMS; DOMAIN STRUCTURE; DOMINANT FACTOR; GRAIN SIZE; LEAKAGE CURRENT ANALYSIS; LOW-LEAKAGE CURRENT; METAL ORGANIC DECOMPOSITION; PIEZOELECTRIC COEFFICIENT; PIEZORESPONSE; X-RAY DIFFRACTION MEASUREMENTS;

ANNEALING; ELECTRIC FIELDS; FACTOR ANALYSIS; GRAIN BOUNDARIES; ORGANOMETALLICS; X RAY DIFFRACTION;

LEAKAGE CURRENTS;

EID: 84867254224 PISSN: 09574522 EISSN: 1573482X Source Type: Journal
DOI: 10.1007/s10854-012-0675-z Document Type: Article

Times cited : (14)

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